{"title":"石英晶体谐振器相位噪声随曲率半径的变化研究","authors":"F. Sthal, J. Boy, M. Mourey, F. Marionnet","doi":"10.1109/FREQ.2001.956354","DOIUrl":null,"url":null,"abstract":"First measurements of the phase noise versus the radius of curvature of SC-cut resonators are given. Resonators with adherent electrodes are investigated and compared with unelectroded resonators. The phase noise measurements are obtained with a crystal resonator tester specifically designed to assist in the characterization of quartz crystal resonators.","PeriodicalId":369101,"journal":{"name":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Phase noise study of quartz crystal resonators versus the radius of curvature\",\"authors\":\"F. Sthal, J. Boy, M. Mourey, F. Marionnet\",\"doi\":\"10.1109/FREQ.2001.956354\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"First measurements of the phase noise versus the radius of curvature of SC-cut resonators are given. Resonators with adherent electrodes are investigated and compared with unelectroded resonators. The phase noise measurements are obtained with a crystal resonator tester specifically designed to assist in the characterization of quartz crystal resonators.\",\"PeriodicalId\":369101,\"journal\":{\"name\":\"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-06-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.2001.956354\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.2001.956354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Phase noise study of quartz crystal resonators versus the radius of curvature
First measurements of the phase noise versus the radius of curvature of SC-cut resonators are given. Resonators with adherent electrodes are investigated and compared with unelectroded resonators. The phase noise measurements are obtained with a crystal resonator tester specifically designed to assist in the characterization of quartz crystal resonators.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
