用于高速兆比特eprom的BiFAMOS技术

G. J. Hu, L. Tran, P. Keshtbod, J. Segal, K. Park, T. Amin, B. Prickett, S.C. Tsao, J. Yen, E. Smith, J. Bornstein, A. Alvarez
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引用次数: 0

摘要

介绍了一种用于高速高密度EPROM应用的先进BiCMOS浮栅雪崩MOS (BiFAMOS)技术。开发访问时间为20ns或更少的芯片以支持没有SRAM接口的33至50 mhz系统是非常有趣的。由于通道热载流子注入用于EPROM编程,大电流和高电压编程条件限制了可以在单元中使用的场效应管的尺寸,因此低单元电流直接影响速度。一种双晶体管电池已经被引入以克服这种速度限制,但以面积为代价。在这里,BiCMOS技术用于缓解这种速度/面积权衡。快速双极感测放大器和大电流NPN驱动器允许在没有大电池电流的情况下进行非常高速的访问。使用1-T细胞,在1 mb EPROM上获得了12 ns的访问时间,这表明该0.8 μ m BiFAMOS能够实现低于20 ns的4M EPROM
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BiFAMOS technology for high speed mega-bit EPROMs
An advanced BiCMOS floating gate avalanche MOS (BiFAMOS) technology for high-speed and high-density EPROM applications is described. It is of great interest to develop chips with access times of 20 ns or less to support 33-to-50-MHz systems without a SRAM interface. Since channel hot carrier injection is used in EPROM programming, the high-current and high-voltage programming conditions limit the size of the FET that can be used in the cell and hence the low cell current directly affects speed. A two-transistor cell has been previously introduced to overcome this speed limitation but at the expense of area. Here, BiCMOS technology is used to alleviate this speed/area tradeoff. Fast bipolar sense amplifiers and high-current NPN drivers allow very-high-speed access without a large cell current. With a 1-T cell, an access time of 12 ns was obtained on a 1-Mb EPROM, demonstrating that this 0.8- mu m BiFAMOS is capable of sub-20-ns 4M EPROMs.<>
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