后硅验证:只有独特的失败才会伤害到你

P. Ahuja
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引用次数: 0

摘要

我们发现,逻辑、设计和架构上的bug并不能控制开发新微处理器的难度。任何可以在模拟中复制的东西都可以快速修复。我们记得的是那些难以复制的、偶尔发生的、不会随着电压或温度而持续失效的bug。我们描述了一个这样的错误,称为SSEL,因为它引起的系统错误信息,一位测试工程师说这是他漫长职业生涯中见过的最奇怪的错误。它仅限于一个输出,并没有出现在其他类似的输出中。它从来没有在一致的时间表上失败过。故障率与晶圆位置密切相关。最后,针对故障的最佳系统级测试之一是让系统停留在命令行提示符处,因为故障与系统活动无关。我们将描述bug的特征、实验结果、缓解策略、修复方法以及根本原因。服务器内置的可靠性和可用性特性使我们能够保护客户免受问题的影响。我们将从大量的真实数据中努力找出这个问题的原因。
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Post-silicon validation: It's the unique fails that hurt you
We have found that logic, design, and architectural bugs do not control the difficulty of bringing up a new microprocessor. Anything that can be reproduced in simulation can be fixed rapidly. The bugs that are hard to reproduce, which occur sporadically, and which don't fail consistently with voltage or temperature are the ones we remember. We describe one such bug, called SSEL for the system error message it caused, which one test engineer said was the strangest bug seen in his long career. It was limited to only one output, and did not occur in other similar outputs. It never failed on a consistent schedule. Failure rates showed a strong correlation with wafer location. Finally, one of the best system level tests for the failure was letting the system sit at the command line prompt, since the failure was not related to system activity. We will describe the characteristics of the bug, the results of experiments with it, our mitigation strategy, our fix, and the root cause. Reliability and availability features built into our servers allowed us to protect customers from the impact of the problem. We will show a large amount of real data from the effort to find the cause of this problem.
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