{"title":"一种利用误差波形对混合信号系统进行有效仿真和诊断的方法","authors":"S. Cherubal, A. Chatterjee","doi":"10.1109/DFTVS.1999.802903","DOIUrl":null,"url":null,"abstract":"In this paper we present a novel approach for fast fault simulation of digital faults in mixed-signal systems without resorting to expensive mixed-signal simulation for every fault. The approach is based on partitioning the mixed-signal circuit and representing digital fault effects using error waveforms. We propose methods to compress a large number of digital fault effects into a few fault syndromes. This results in significant savings in fault simulation effort. We demonstrate the ability to differentiate fault syndromes of different partitions of the circuit.","PeriodicalId":448322,"journal":{"name":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A methodology for efficient simulation and diagnosis of mixed-signal systems using error waveforms\",\"authors\":\"S. Cherubal, A. Chatterjee\",\"doi\":\"10.1109/DFTVS.1999.802903\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we present a novel approach for fast fault simulation of digital faults in mixed-signal systems without resorting to expensive mixed-signal simulation for every fault. The approach is based on partitioning the mixed-signal circuit and representing digital fault effects using error waveforms. We propose methods to compress a large number of digital fault effects into a few fault syndromes. This results in significant savings in fault simulation effort. We demonstrate the ability to differentiate fault syndromes of different partitions of the circuit.\",\"PeriodicalId\":448322,\"journal\":{\"name\":\"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1999.802903\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1999.802903","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A methodology for efficient simulation and diagnosis of mixed-signal systems using error waveforms
In this paper we present a novel approach for fast fault simulation of digital faults in mixed-signal systems without resorting to expensive mixed-signal simulation for every fault. The approach is based on partitioning the mixed-signal circuit and representing digital fault effects using error waveforms. We propose methods to compress a large number of digital fault effects into a few fault syndromes. This results in significant savings in fault simulation effort. We demonstrate the ability to differentiate fault syndromes of different partitions of the circuit.