使用行为和门级硬件模型的分层故障仿真

S. Mirkhani, Meisam Lavasani, Z. Navabi
{"title":"使用行为和门级硬件模型的分层故障仿真","authors":"S. Mirkhani, Meisam Lavasani, Z. Navabi","doi":"10.1109/ATS.2002.1181740","DOIUrl":null,"url":null,"abstract":"This paper presents a fault simulation environment that takes advantage of available models at the behavioral and gate levels of abstraction. The simulation takes place in VHDL and for fault simulation, special VHDL models are written that are capable of propagating circuit faults. Behavioral VHDL models propagate fault effects that appear on their input ports; in addition to this, gate level VHDL models are capable of injecting faults on their output lines. The fault simulation environment assumes the existence of the gate level and behavioral models for every component, and uses the appropriate model depending on whether a fault belongs to it or another component. A wrapper simulation model that encloses both models of a component switches automatically between the models. The wrapper takes care of feedback in the sequential circuits by always selecting the gate level of a component for propagating its own faults. This environment fits well with the hardware description language settings in which pre-synthesis behavioral models, post-synthesis gate-level models and a mixed simulation environment are available. The paper shows a mathematical analysis illustrating the performance improvement of this method over the traditional gate-level fault simulation.","PeriodicalId":199542,"journal":{"name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Hierarchical fault simulation using behavioral and gate level hardware models\",\"authors\":\"S. Mirkhani, Meisam Lavasani, Z. Navabi\",\"doi\":\"10.1109/ATS.2002.1181740\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a fault simulation environment that takes advantage of available models at the behavioral and gate levels of abstraction. The simulation takes place in VHDL and for fault simulation, special VHDL models are written that are capable of propagating circuit faults. Behavioral VHDL models propagate fault effects that appear on their input ports; in addition to this, gate level VHDL models are capable of injecting faults on their output lines. The fault simulation environment assumes the existence of the gate level and behavioral models for every component, and uses the appropriate model depending on whether a fault belongs to it or another component. A wrapper simulation model that encloses both models of a component switches automatically between the models. The wrapper takes care of feedback in the sequential circuits by always selecting the gate level of a component for propagating its own faults. This environment fits well with the hardware description language settings in which pre-synthesis behavioral models, post-synthesis gate-level models and a mixed simulation environment are available. The paper shows a mathematical analysis illustrating the performance improvement of this method over the traditional gate-level fault simulation.\",\"PeriodicalId\":199542,\"journal\":{\"name\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2002.1181740\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2002.1181740","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 19

摘要

本文提出了一个故障仿真环境,该环境在行为和门的抽象层次上利用了可用的模型。仿真在VHDL中进行,对于故障仿真,编写了能够传播电路故障的专用VHDL模型。行为VHDL模型传播出现在其输入端口上的故障效应;除此之外,门级VHDL模型能够在其输出线上注入故障。故障仿真环境假定存在每个组件的门级和行为模型,并根据故障是属于本组件还是属于其他组件使用适当的模型。封装组件的两个模型的包装器仿真模型在模型之间自动切换。封装器通过始终选择组件的门电平来传播其自身的故障,从而处理顺序电路中的反馈。该环境非常适合硬件描述语言设置,其中可以使用合成前行为模型、合成后门级模型和混合仿真环境。通过数学分析表明,该方法与传统的门级故障仿真相比,性能有所提高。
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Hierarchical fault simulation using behavioral and gate level hardware models
This paper presents a fault simulation environment that takes advantage of available models at the behavioral and gate levels of abstraction. The simulation takes place in VHDL and for fault simulation, special VHDL models are written that are capable of propagating circuit faults. Behavioral VHDL models propagate fault effects that appear on their input ports; in addition to this, gate level VHDL models are capable of injecting faults on their output lines. The fault simulation environment assumes the existence of the gate level and behavioral models for every component, and uses the appropriate model depending on whether a fault belongs to it or another component. A wrapper simulation model that encloses both models of a component switches automatically between the models. The wrapper takes care of feedback in the sequential circuits by always selecting the gate level of a component for propagating its own faults. This environment fits well with the hardware description language settings in which pre-synthesis behavioral models, post-synthesis gate-level models and a mixed simulation environment are available. The paper shows a mathematical analysis illustrating the performance improvement of this method over the traditional gate-level fault simulation.
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