在封装元件供应基地启用低温焊料(LTS)技术的挑战和关键经验

Anna Prakash, K. Byrd, R. Sidhu, S. Elhalawaty, Nevil M. Wu, Hiroshi Okumura, Srinivas Erukula, Jason Lim
{"title":"在封装元件供应基地启用低温焊料(LTS)技术的挑战和关键经验","authors":"Anna Prakash, K. Byrd, R. Sidhu, S. Elhalawaty, Nevil M. Wu, Hiroshi Okumura, Srinivas Erukula, Jason Lim","doi":"10.1109/ECTC32696.2021.00112","DOIUrl":null,"url":null,"abstract":"There has been a great interest in the use of low temperature soldering (LTS) for surface mount technology (SMT) in the past five years. Low temperature solder (LTS) technology improves the package warpage by reducing thermo-mechanical stress during SMT reflow. Several other benefits with LTS include environmental benefits, decreased carbon emissions, and lower electricity consumption. In this study, LTS technology has been evaluated on several electronic components such as, Integrated circuit (IC), memory, ASIC, and passives. Using several LTS formulations, Solder Joint Reliability (SJR) properties were characterized EOL as well as after reliability testing at components suppliers. Several different package types (i.e. QFN, LGA, CSP, WLCSP etc.), and surface finishes were used in this study. For some of the IC components, different types of packages were evaluated: land grid array (LGA) and quad flat no leads (QFN). Different paste formulations having (35–58 wt.% Bi content) were used in these evaluations and SAC305 was the POR/control leg used. Temperature cycle and other reliability data showed promising results with comparable data for both LTS and SAC legs. The goal in this paper is to document some of the challenges in components supply chain enabling and key learnings on the factors that modulate LTS solder joint reliability for various components during SMT process.","PeriodicalId":351817,"journal":{"name":"2021 IEEE 71st Electronic Components and Technology Conference (ECTC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2021-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Challenges and key learnings in enabling Low Temperature Solder (LTS) technology at packaging components supply base\",\"authors\":\"Anna Prakash, K. Byrd, R. Sidhu, S. Elhalawaty, Nevil M. Wu, Hiroshi Okumura, Srinivas Erukula, Jason Lim\",\"doi\":\"10.1109/ECTC32696.2021.00112\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"There has been a great interest in the use of low temperature soldering (LTS) for surface mount technology (SMT) in the past five years. Low temperature solder (LTS) technology improves the package warpage by reducing thermo-mechanical stress during SMT reflow. Several other benefits with LTS include environmental benefits, decreased carbon emissions, and lower electricity consumption. In this study, LTS technology has been evaluated on several electronic components such as, Integrated circuit (IC), memory, ASIC, and passives. Using several LTS formulations, Solder Joint Reliability (SJR) properties were characterized EOL as well as after reliability testing at components suppliers. Several different package types (i.e. QFN, LGA, CSP, WLCSP etc.), and surface finishes were used in this study. For some of the IC components, different types of packages were evaluated: land grid array (LGA) and quad flat no leads (QFN). Different paste formulations having (35–58 wt.% Bi content) were used in these evaluations and SAC305 was the POR/control leg used. Temperature cycle and other reliability data showed promising results with comparable data for both LTS and SAC legs. The goal in this paper is to document some of the challenges in components supply chain enabling and key learnings on the factors that modulate LTS solder joint reliability for various components during SMT process.\",\"PeriodicalId\":351817,\"journal\":{\"name\":\"2021 IEEE 71st Electronic Components and Technology Conference (ECTC)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 71st Electronic Components and Technology Conference (ECTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC32696.2021.00112\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 71st Electronic Components and Technology Conference (ECTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC32696.2021.00112","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

在过去的五年中,在表面贴装技术(SMT)中使用低温焊接(LTS)引起了极大的兴趣。低温焊料(LTS)技术通过减少SMT回流过程中的热机械应力来改善封装翘曲。LTS的其他好处包括环境效益、减少碳排放和降低电力消耗。在这项研究中,LTS技术已经在几个电子元件上进行了评估,如集成电路(IC),存储器,ASIC和无源。使用几种LTS配方,在EOL和组件供应商进行可靠性测试后,对焊点可靠性(SJR)特性进行了表征。本研究中使用了几种不同的包装类型(即QFN, LGA, CSP, WLCSP等)和表面处理。对于一些IC组件,评估了不同类型的封装:陆地网格阵列(LGA)和四平无引线(QFN)。在这些评估中使用了不同的膏体配方(Bi含量为35-58 wt.%), SAC305是使用的POR/对照腿。温度循环和其他可靠性数据与LTS和SAC腿的可比数据显示了令人鼓舞的结果。本文的目标是记录组件供应链实现中的一些挑战,以及在SMT过程中调节各种组件的LTS焊点可靠性的因素的关键学习。
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Challenges and key learnings in enabling Low Temperature Solder (LTS) technology at packaging components supply base
There has been a great interest in the use of low temperature soldering (LTS) for surface mount technology (SMT) in the past five years. Low temperature solder (LTS) technology improves the package warpage by reducing thermo-mechanical stress during SMT reflow. Several other benefits with LTS include environmental benefits, decreased carbon emissions, and lower electricity consumption. In this study, LTS technology has been evaluated on several electronic components such as, Integrated circuit (IC), memory, ASIC, and passives. Using several LTS formulations, Solder Joint Reliability (SJR) properties were characterized EOL as well as after reliability testing at components suppliers. Several different package types (i.e. QFN, LGA, CSP, WLCSP etc.), and surface finishes were used in this study. For some of the IC components, different types of packages were evaluated: land grid array (LGA) and quad flat no leads (QFN). Different paste formulations having (35–58 wt.% Bi content) were used in these evaluations and SAC305 was the POR/control leg used. Temperature cycle and other reliability data showed promising results with comparable data for both LTS and SAC legs. The goal in this paper is to document some of the challenges in components supply chain enabling and key learnings on the factors that modulate LTS solder joint reliability for various components during SMT process.
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