I/O驱动信号/电源完整性的类ibis模型研究

Shubham Saxena, Malek Souilem, W. Dghais, J. N. Tripathi, H. Shrimali
{"title":"I/O驱动信号/电源完整性的类ibis模型研究","authors":"Shubham Saxena, Malek Souilem, W. Dghais, J. N. Tripathi, H. Shrimali","doi":"10.1109/SPIN52536.2021.9566125","DOIUrl":null,"url":null,"abstract":"This paper presents a study on non-linear modeling, reported in the state-of-the-art in the last decade for I/O drivers. The study includes the IBIS-like modeling techniques including package parasitics. The IBIS-like model has been analyzed mathematically and validated using 28 nm CMOS technology of TSMC foundry. For validation purposes, the predriver circuit and the I/O buffers have been simulated with 0.9 V of VDD. The IBIS-like nonlinear models have been created using Simulink® and the results have been compared with the Electronic Design Automation (EDA) tools. The Simulink® results show a Normalized Mean Square Error (NMSE) of - 51.91 dB with 1.63 sec of CPU time for the case of pull-up current, -49.42 dB with 474.34 msec of CPU time for the case of pulldown current response. In the case of output voltage response, the NMSE is - 48.33 dB and 2.12 sec of CPU time.","PeriodicalId":343177,"journal":{"name":"2021 8th International Conference on Signal Processing and Integrated Networks (SPIN)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Study on an IBIS-like Model to Ensure Signal/Power Integrity for I/O Drivers\",\"authors\":\"Shubham Saxena, Malek Souilem, W. Dghais, J. N. Tripathi, H. Shrimali\",\"doi\":\"10.1109/SPIN52536.2021.9566125\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a study on non-linear modeling, reported in the state-of-the-art in the last decade for I/O drivers. The study includes the IBIS-like modeling techniques including package parasitics. The IBIS-like model has been analyzed mathematically and validated using 28 nm CMOS technology of TSMC foundry. For validation purposes, the predriver circuit and the I/O buffers have been simulated with 0.9 V of VDD. The IBIS-like nonlinear models have been created using Simulink® and the results have been compared with the Electronic Design Automation (EDA) tools. The Simulink® results show a Normalized Mean Square Error (NMSE) of - 51.91 dB with 1.63 sec of CPU time for the case of pull-up current, -49.42 dB with 474.34 msec of CPU time for the case of pulldown current response. In the case of output voltage response, the NMSE is - 48.33 dB and 2.12 sec of CPU time.\",\"PeriodicalId\":343177,\"journal\":{\"name\":\"2021 8th International Conference on Signal Processing and Integrated Networks (SPIN)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-08-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 8th International Conference on Signal Processing and Integrated Networks (SPIN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SPIN52536.2021.9566125\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 8th International Conference on Signal Processing and Integrated Networks (SPIN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPIN52536.2021.9566125","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文介绍了一项非线性建模的研究,在过去十年中,最先进的I/O驱动程序报告。研究包括包寄生在内的类ibis建模技术。采用TSMC代工厂的28纳米CMOS技术对类ibis模型进行了数学分析和验证。为了验证目的,用0.9 V的VDD模拟了预驱动电路和I/O缓冲器。利用Simulink®建立了类似ibis的非线性模型,并将结果与电子设计自动化(EDA)工具进行了比较。Simulink®结果显示,上拉电流响应的归一化均方误差(NMSE)为- 51.91 dB, CPU时间为1.63秒;下拉电流响应的归一化均方误差(NMSE)为-49.42 dB, CPU时间为474.34 msec。在输出电压响应的情况下,NMSE为- 48.33 dB, CPU时间为2.12秒。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A Study on an IBIS-like Model to Ensure Signal/Power Integrity for I/O Drivers
This paper presents a study on non-linear modeling, reported in the state-of-the-art in the last decade for I/O drivers. The study includes the IBIS-like modeling techniques including package parasitics. The IBIS-like model has been analyzed mathematically and validated using 28 nm CMOS technology of TSMC foundry. For validation purposes, the predriver circuit and the I/O buffers have been simulated with 0.9 V of VDD. The IBIS-like nonlinear models have been created using Simulink® and the results have been compared with the Electronic Design Automation (EDA) tools. The Simulink® results show a Normalized Mean Square Error (NMSE) of - 51.91 dB with 1.63 sec of CPU time for the case of pull-up current, -49.42 dB with 474.34 msec of CPU time for the case of pulldown current response. In the case of output voltage response, the NMSE is - 48.33 dB and 2.12 sec of CPU time.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Temperature Compensation Circuit for ISFET based pH Sensor Knowledge Adaptation for Cross-Domain Opinion Mining Voltage Profile Enhancement of a 33 Bus System Integrated with Renewable Energy Sources and Electric Vehicle Power Quality Enhancement of Cascaded H Bridge 5 Level and 7 Level Inverters PIC simulation study of Beam Tunnel for W- Band high power Gyrotron
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1