劈开漏极隧道场效应晶体管源工程的影响

A. Bhattacharya, Debadipta Basak, S. Reddy, S. Sarkar
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引用次数: 1

摘要

本文给出了二维TFET模型源极和漏极掺杂工程的分析结果。两种不同的模型已被广泛研究,它们由不同掺杂浓度的劈裂源区和劈裂漏区组成。两种型号均由劈裂漏极、劈裂源和双劈裂源组成,分别称为劈裂源劈裂漏极TFET (SS-SD TFET)和双劈裂源劈裂漏极TFET (DSS-SD TFET)。将该器件的特性与分路漏极(SD TFET)模型进行了比较,发现双极导通(OFF电流)降低,隧穿效应增强。利用Silvaco, Atlas进行了仿真。
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Impact of Source Engineering in Split Drain Tunnel Field Effect Transistor
This paper confers the results of the analysis of source and drain doping engineering for a 2D TFET model. Two different models have been extensively studied that are composed of split source and split drain region with varying doping concentration. Both the models consist of split drain, one with split source and another with double split source and are specified as Split Source Split Drain TFET (SS-SD TFET)and Double Split Source Split Drain TFET (DSS-SD TFET). The device characteristics are compared with Split Drain (SD TFET)model and the improvements are registered that exhibits reduction in ambipolar conduction (OFF current)along with the increase of tunneling effect. Simulations are performed using Silvaco, Atlas.
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