{"title":"表面贴装器件的热特性","authors":"B. Siegal","doi":"10.1109/STHERM.1993.225326","DOIUrl":null,"url":null,"abstract":"A methodology for the thermal characterization of surface mount devices (SMDs) is proposed. Measured data are shown only for the relative evaluation of various thermal test conditions and environments. Specific topics covered include the design of a suitable thermal test board; the mounting and orientation of the device for the thermal measurement in still and moving air environments; and collection, analysis and presentation of the data and detailed documentation of the test conditions and environment. The latter is especially important if the measurements are to be repeated by the SMD vendor or duplicated by the SMD user. The thermal test board design is discussed from the standpoint of existing standards and low-cost alternatives. The moving air environment, implemented with a variation of an industry standard design and designed to provide up to 1000 linear feet per minute capability, is discussed with the intent of establishing a new industry standard design.<<ETX>>","PeriodicalId":369022,"journal":{"name":"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-02-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Thermal characterization of surface mount devices\",\"authors\":\"B. Siegal\",\"doi\":\"10.1109/STHERM.1993.225326\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A methodology for the thermal characterization of surface mount devices (SMDs) is proposed. Measured data are shown only for the relative evaluation of various thermal test conditions and environments. Specific topics covered include the design of a suitable thermal test board; the mounting and orientation of the device for the thermal measurement in still and moving air environments; and collection, analysis and presentation of the data and detailed documentation of the test conditions and environment. The latter is especially important if the measurements are to be repeated by the SMD vendor or duplicated by the SMD user. The thermal test board design is discussed from the standpoint of existing standards and low-cost alternatives. The moving air environment, implemented with a variation of an industry standard design and designed to provide up to 1000 linear feet per minute capability, is discussed with the intent of establishing a new industry standard design.<<ETX>>\",\"PeriodicalId\":369022,\"journal\":{\"name\":\"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-02-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.1993.225326\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1993 Proceedings] Ninth Annual IEEE Semiconductor Thermal Measurement and Management Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.1993.225326","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

提出了一种表面贴装器件(smd)的热表征方法。测量数据仅用于各种热测试条件和环境的相对评估。具体涉及的主题包括设计合适的热测试板;在静止和流动空气环境中进行热测量的装置的安装和定位;收集、分析和展示试验条件和环境的数据和详细文件。如果SMD供应商要重复测量或SMD用户要重复测量,则后者尤其重要。从现有标准和低成本替代方案的角度讨论了热测试板的设计。移动空气环境采用了行业标准设计的变体,旨在提供高达每分钟1000线性英尺的能力,旨在建立新的行业标准设计
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Thermal characterization of surface mount devices
A methodology for the thermal characterization of surface mount devices (SMDs) is proposed. Measured data are shown only for the relative evaluation of various thermal test conditions and environments. Specific topics covered include the design of a suitable thermal test board; the mounting and orientation of the device for the thermal measurement in still and moving air environments; and collection, analysis and presentation of the data and detailed documentation of the test conditions and environment. The latter is especially important if the measurements are to be repeated by the SMD vendor or duplicated by the SMD user. The thermal test board design is discussed from the standpoint of existing standards and low-cost alternatives. The moving air environment, implemented with a variation of an industry standard design and designed to provide up to 1000 linear feet per minute capability, is discussed with the intent of establishing a new industry standard design.<>
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