温度自适应体偏置和电源电压缩放提高纳米cmos电路的能量效率

R. Kumar, V. Kursun
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引用次数: 6

摘要

在不久的将来,CMOS电路的温度依赖传播延迟特性将经历一个完全的逆转。与老一代技术相反,32纳米CMOS技术中的标准零体偏置电路的速度在标称电源电压下温度升高时得到增强。电路速度的提高为降低有源电路在高温下消耗的能量提供了新的机会。为了在不降低电路速度的前提下降低高温有源模式的能量消耗,本文提出了温度自适应供电和阈值电压调谐技术。结果表明,在高温下动态调整电源电压可使能耗降低21%。另一种基于温度自适应反向体偏置的替代技术可以成倍地降低mosfet的漏电流和寄生结电容。与高温下的标准零体偏电路相比,通过反向体偏进行温度自适应阈值电压调谐可产生高达29.8%的有源模式能量降低。
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Temperature-adaptive body-bias and supply voltage scaling for enhanced energy efficiency in nano-CMOS circuits
Temperature dependent propagation delay characteristics of CMOS circuits will experience a complete reversal in the near future. Contrary to the older technology generations, the speed of standard zero-body-biased circuits in a 32 nm CMOS technology is enhanced when the temperature is increased at the nominal supply voltage. The enhancement of circuit speed provides new opportunities to lower the energy consumed by active circuits at elevated temperatures. Temperature-adaptive supply and threshold voltage tuning techniques are proposed in this paper to reduce the high temperature active mode energy consumption without degrading the circuit speed. Results indicate that the energy consumption can be lowered by up to 21% by dynamically scaling the supply voltage at elevated temperatures. An alternative technique based on temperature-adaptive reverse body-bias exponentially reduces the leakage currents as well as the parasitic junction capacitances of the MOSFETs. The temperature-adaptive threshold voltage tuning through reverse body-bias yields an active mode energy reduction by up to 29.8% as compared to the standard zero body-biased circuits at high temperatures.
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