基于28nm PolarFire sonos FPGA的总电离剂量表征

2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2019-09-01 DOI:10.1109/radecs47380.2019.9745684

N. Rezzak, Jih-Jong Wang, Alex Cai, F. Hawley, E. Hamdy

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摘要

本文介绍了基于28nm PolarFire™sonos的FPGA上的总电离剂量(TID)结果。伽玛和x射线诱导的TID效应在设备和产品水平提出和讨论。PolarFire表现出非常好的TID性能，并且耐辐射高达100 krad(SiO2)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Total Ionizing Dose Characterization of 28 nm PolarFire SONOS-based FPGA

This paper presents Total Ionizing Dose (TID) results on 28nm PolarFire™ SONOS-based FPGA. Gamma and X-ray induced TID effects at the device and product level are presented and discussed. PolarFire shows very good TID performance and is radiation-tolerant up to 100 krad(SiO2).

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2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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