用回流锡凸点进行芯片间的机械嵌缝互连

Ju-Heon Yang, Young-Ho Kim, J. Moon, Won-Jong Lee
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引用次数: 2

摘要

近年来发展了一种利用机械嵌缝的芯片间互连新方法。在这种方法中,芯片之间的键合是通过将芯片上的Au螺柱突起变形注入另一个芯片的通孔来实现的。由于锡比金更容易变形,本文介绍了一种用回流锡凸块代替金凸块的改进嵌缝技术。在室温和270℃条件下,利用回流锡凸点和通孔电极成功地实现了芯片间的互连。焊点的接触电阻小于35moma。
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Chip-To-Chip Interconnection by Mechanical Caulking Using Reflowed Sn Bumps
A new chip-to-chip interconnection method utilizing mechanical caulking has been developed recently. In this method, bonding between the chips is achieved by deformation-injection of Au stud bump on a chip into the through via hole in the other chip. In this paper, we introduce a modified caulking technology using reflowed Sn bumps instead Au stud bumps since Sn can be deformed more easily than Au. The chip-to-chip interconnection using reflowed Sn bumps and through via hole electrodes was successfully made at room temperature or at 270degC. The contact resistance of the solder joint was less than 35 mOmega per joint.
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