{"title":"一种利用异质堆叠源提高SELBOX晶体管性能的方法","authors":"Sagarika Choudhury, K. L. Baishnab, K. Guha","doi":"10.1109/ISDCS49393.2020.9262985","DOIUrl":null,"url":null,"abstract":"The proposed work incorporates advantage of hetero-stacked source and Selective Buried Oxide (SELBOX) structure in a single device. A comparative performance assessment of the presented structure with the existing structures has been done after analyzing critical parameters. The parameters such as drain current, sub-threshold swing, and capacitances are studied for the proposed structure. It has been observed that the structure improves the ION/IOFF ratio and Subthreshold Swing (SS). A current ratio of 1010 and Point subthreshold swing of 27 mV/dec and Average SS of 36 mV/dec is obtained. An On-current of 2.2 x 10-6A is also observed.","PeriodicalId":177307,"journal":{"name":"2020 International Symposium on Devices, Circuits and Systems (ISDCS)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An approach to improve performance of an SELBOX TFET using hetero-stacked source\",\"authors\":\"Sagarika Choudhury, K. L. Baishnab, K. Guha\",\"doi\":\"10.1109/ISDCS49393.2020.9262985\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The proposed work incorporates advantage of hetero-stacked source and Selective Buried Oxide (SELBOX) structure in a single device. A comparative performance assessment of the presented structure with the existing structures has been done after analyzing critical parameters. The parameters such as drain current, sub-threshold swing, and capacitances are studied for the proposed structure. It has been observed that the structure improves the ION/IOFF ratio and Subthreshold Swing (SS). A current ratio of 1010 and Point subthreshold swing of 27 mV/dec and Average SS of 36 mV/dec is obtained. An On-current of 2.2 x 10-6A is also observed.\",\"PeriodicalId\":177307,\"journal\":{\"name\":\"2020 International Symposium on Devices, Circuits and Systems (ISDCS)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-03-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 International Symposium on Devices, Circuits and Systems (ISDCS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISDCS49393.2020.9262985\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Symposium on Devices, Circuits and Systems (ISDCS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISDCS49393.2020.9262985","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
所提出的工作在单个器件中结合了异质堆叠源和选择性埋藏氧化物(SELBOX)结构的优点。通过对关键参数的分析,对所提出的结构与现有结构进行了性能对比评估。研究了漏极电流、亚阈值摆幅和电容等参数。观察到,该结构改善了离子/ off比和亚阈值摆幅(SS)。电流比为1010,点亚阈值摆幅为27 mV/dec,平均SS为36 mV/dec。也观察到2.2 x 10-6A的导通电流。
An approach to improve performance of an SELBOX TFET using hetero-stacked source
The proposed work incorporates advantage of hetero-stacked source and Selective Buried Oxide (SELBOX) structure in a single device. A comparative performance assessment of the presented structure with the existing structures has been done after analyzing critical parameters. The parameters such as drain current, sub-threshold swing, and capacitances are studied for the proposed structure. It has been observed that the structure improves the ION/IOFF ratio and Subthreshold Swing (SS). A current ratio of 1010 and Point subthreshold swing of 27 mV/dec and Average SS of 36 mV/dec is obtained. An On-current of 2.2 x 10-6A is also observed.