A. Deutsch, H.H. Smith, G. Kopcsay, B. Krauter, C. Surovic, A. Elfadel, D. Widiger
{"title":"理解宽数据总线上的共模噪声","authors":"A. Deutsch, H.H. Smith, G. Kopcsay, B. Krauter, C. Surovic, A. Elfadel, D. Widiger","doi":"10.1109/EPEP.2003.1250056","DOIUrl":null,"url":null,"abstract":"This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(f)L(f)C behavior of the reference series impedance.","PeriodicalId":254477,"journal":{"name":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Understanding common-mode noise on wide data-buses\",\"authors\":\"A. Deutsch, H.H. Smith, G. Kopcsay, B. Krauter, C. Surovic, A. Elfadel, D. Widiger\",\"doi\":\"10.1109/EPEP.2003.1250056\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(f)L(f)C behavior of the reference series impedance.\",\"PeriodicalId\":254477,\"journal\":{\"name\":\"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2003.1250056\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2003.1250056","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Understanding common-mode noise on wide data-buses
This paper discusses the effects of the frequency-dependent losses in the reference return path for wide, on-chip data buses, that must be understood in order to accurately predict the interaction and summation of crosstalk and common-mode noise signals. This interaction can generate excessive noise for on-chip global interconnections. Measured and simulated results are shown for representative 8-12 line couplings and circuit-synthesis techniques are shown to capture the correct R(f)L(f)C behavior of the reference series impedance.