Hojong Chang, B. Han, G. Cho, Yongho Kim, Woosook Jeon, Hyunduk Kim
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Optimization of the effect of radiation on ASIC chip through detector
The photon counting detecting system is a direct image detection method that counts one by one when incident photons are larger than noise. So it is differs from conventional radiation image detecting equipment. This system has an advantage of measuring low dose and low energy and also possible to make a colorful image. In this study we were targeting CdZnTe semiconductor as detector. Optimize CdZnTe’s thickness to consider the influence of the X-ray passing through CdZnTe on the ROIC circuit using Geant4 simulation.
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