{"title":"面向设计的CMOS逆变器延迟模型","authors":"F. Marranghello, A. Reis, R. Ribas","doi":"10.1109/SBCCI.2012.6344424","DOIUrl":null,"url":null,"abstract":"This paper presents a new design oriented model for estimating the delay of a CMOS inverter. The model considers the impact of input transition time, input-to-output coupling capacitance, and physical effects such as drain-induced barrier lowering (DIBL) and velocity saturation. Thus, it is quite suitable for nanometer technologies. Moreover, no fitting parameters are required. Results are in very good agreement with HSPICE simulations based on BSIM4 transistor model over a wide range of input slopes and output loads, considering different inverter configurations. An average error of 3% in correlation to HSPICE has been attained.","PeriodicalId":311528,"journal":{"name":"2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI)","volume":"07 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Design-oriented delay model for CMOS inverter\",\"authors\":\"F. Marranghello, A. Reis, R. Ribas\",\"doi\":\"10.1109/SBCCI.2012.6344424\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new design oriented model for estimating the delay of a CMOS inverter. The model considers the impact of input transition time, input-to-output coupling capacitance, and physical effects such as drain-induced barrier lowering (DIBL) and velocity saturation. Thus, it is quite suitable for nanometer technologies. Moreover, no fitting parameters are required. Results are in very good agreement with HSPICE simulations based on BSIM4 transistor model over a wide range of input slopes and output loads, considering different inverter configurations. An average error of 3% in correlation to HSPICE has been attained.\",\"PeriodicalId\":311528,\"journal\":{\"name\":\"2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI)\",\"volume\":\"07 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SBCCI.2012.6344424\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 25th Symposium on Integrated Circuits and Systems Design (SBCCI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SBCCI.2012.6344424","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents a new design oriented model for estimating the delay of a CMOS inverter. The model considers the impact of input transition time, input-to-output coupling capacitance, and physical effects such as drain-induced barrier lowering (DIBL) and velocity saturation. Thus, it is quite suitable for nanometer technologies. Moreover, no fitting parameters are required. Results are in very good agreement with HSPICE simulations based on BSIM4 transistor model over a wide range of input slopes and output loads, considering different inverter configurations. An average error of 3% in correlation to HSPICE has been attained.