直流电压阻断过程中GTO失效模式分析

Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics Pub Date : 1994-05-31 DOI:10.1109/ISPSD.1994.583727

H. Matsuda, T. Fujiwara, M. Hiyoshi, K. Nishitani, A. Kuwako, T. Ikehara

{"title":"直流电压阻断过程中GTO失效模式分析","authors":"H. Matsuda, T. Fujiwara, M. Hiyoshi, K. Nishitani, A. Kuwako, T. Ikehara","doi":"10.1109/ISPSD.1994.583727","DOIUrl":null,"url":null,"abstract":"GTOs suddenly failed without any leakage current increase before the failure event, during DC voltage blocking. From various experiments and the analysis, we have come to the inference that the GTO failure was caused by cosmic-rays at sea level. The failure rate of the improved GTOs decreases by more than one order.","PeriodicalId":405897,"journal":{"name":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1994-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":"{\"title\":\"Analysis of GTO failure mode during DC voltage blocking\",\"authors\":\"H. Matsuda, T. Fujiwara, M. Hiyoshi, K. Nishitani, A. Kuwako, T. Ikehara\",\"doi\":\"10.1109/ISPSD.1994.583727\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"GTOs suddenly failed without any leakage current increase before the failure event, during DC voltage blocking. From various experiments and the analysis, we have come to the inference that the GTO failure was caused by cosmic-rays at sea level. The failure rate of the improved GTOs decreases by more than one order.\",\"PeriodicalId\":405897,\"journal\":{\"name\":\"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"25\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1994.583727\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1994.583727","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 25

摘要

在直流电压阻断过程中，gto突然失效，而在失效事件之前没有任何泄漏电流增加。从各种实验和分析中，我们得出结论，GTO的失效是由海平面上的宇宙射线引起的。改进后的GTOs故障率降低了一个数量级以上。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Analysis of GTO failure mode during DC voltage blocking

GTOs suddenly failed without any leakage current increase before the failure event, during DC voltage blocking. From various experiments and the analysis, we have come to the inference that the GTO failure was caused by cosmic-rays at sea level. The failure rate of the improved GTOs decreases by more than one order.

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Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics

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