{"title":"面向集成电路、封装和电路板协同设计的准静态和全波耦合分析","authors":"J. Mao, G. Fitzgerald, A. Kuo, S. Wane","doi":"10.1109/EPEP.2007.4387137","DOIUrl":null,"url":null,"abstract":"In this paper, cascade-related approach and global one-single model methodology are investigated and compared in reference to real-world System-in-Package (SiP) product, which is designed using Cadence-SiP, and analyzed using Optimal SiP-enabled tool suite. A complete multi-level path, which consists of three portions-integrated circuit (IC), package and printed-circuit-board (PCB) -is selected as a test vehicle to investigate the limit of cascade-based approach. The results from quasi-static and full-wave simulation are compared, and the advantage of full-wave as well as limitation of quasi-static model are discussed. An innovative concept, referenced as \"residual S-parameter\", is proposed to characterize the coupling at the interface of IC, package and PCB, which plays an important role in the cascading of individual modules. Impact of the proposed concept on power integrity (PI) and signal integrity (SI) analysis is emphasized. Comparisons between full-wave, quasi-static and measurement results for representative component elements (interconnect, coupled bond wires) are discussed.","PeriodicalId":402571,"journal":{"name":"2007 IEEE Electrical Performance of Electronic Packaging","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Coupled Analysis of Quasi-static and Full-Wave Solution towards IC, Package and Board Co-design\",\"authors\":\"J. Mao, G. Fitzgerald, A. Kuo, S. Wane\",\"doi\":\"10.1109/EPEP.2007.4387137\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, cascade-related approach and global one-single model methodology are investigated and compared in reference to real-world System-in-Package (SiP) product, which is designed using Cadence-SiP, and analyzed using Optimal SiP-enabled tool suite. A complete multi-level path, which consists of three portions-integrated circuit (IC), package and printed-circuit-board (PCB) -is selected as a test vehicle to investigate the limit of cascade-based approach. The results from quasi-static and full-wave simulation are compared, and the advantage of full-wave as well as limitation of quasi-static model are discussed. An innovative concept, referenced as \\\"residual S-parameter\\\", is proposed to characterize the coupling at the interface of IC, package and PCB, which plays an important role in the cascading of individual modules. Impact of the proposed concept on power integrity (PI) and signal integrity (SI) analysis is emphasized. Comparisons between full-wave, quasi-static and measurement results for representative component elements (interconnect, coupled bond wires) are discussed.\",\"PeriodicalId\":402571,\"journal\":{\"name\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Electrical Performance of Electronic Packaging\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2007.4387137\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Electrical Performance of Electronic Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2007.4387137","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Coupled Analysis of Quasi-static and Full-Wave Solution towards IC, Package and Board Co-design
In this paper, cascade-related approach and global one-single model methodology are investigated and compared in reference to real-world System-in-Package (SiP) product, which is designed using Cadence-SiP, and analyzed using Optimal SiP-enabled tool suite. A complete multi-level path, which consists of three portions-integrated circuit (IC), package and printed-circuit-board (PCB) -is selected as a test vehicle to investigate the limit of cascade-based approach. The results from quasi-static and full-wave simulation are compared, and the advantage of full-wave as well as limitation of quasi-static model are discussed. An innovative concept, referenced as "residual S-parameter", is proposed to characterize the coupling at the interface of IC, package and PCB, which plays an important role in the cascading of individual modules. Impact of the proposed concept on power integrity (PI) and signal integrity (SI) analysis is emphasized. Comparisons between full-wave, quasi-static and measurement results for representative component elements (interconnect, coupled bond wires) are discussed.