面向集成电路、封装和电路板协同设计的准静态和全波耦合分析

J. Mao, G. Fitzgerald, A. Kuo, S. Wane
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引用次数: 11

摘要

本文对级联相关方法和全局单模型方法进行了研究,并与使用Cadence-SiP设计的实际系统级封装(SiP)产品进行了比较,并使用支持最优SiP的工具套件进行了分析。选择由集成电路(IC)、封装和印刷电路板(PCB)三部分组成的完整多级路径作为测试载体,研究基于级联的方法的局限性。比较了准静态模型和全波模型的模拟结果,讨论了全波模型的优点和准静态模型的局限性。提出了一个创新的概念,称为“剩余s参数”,以表征集成电路、封装和PCB接口的耦合,这在单个模块的级联中起着重要作用。强调了所提概念对功率完整性(PI)和信号完整性(SI)分析的影响。讨论了代表性元件(互连线、耦合键合线)的全波、准静态和测量结果的比较。
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Coupled Analysis of Quasi-static and Full-Wave Solution towards IC, Package and Board Co-design
In this paper, cascade-related approach and global one-single model methodology are investigated and compared in reference to real-world System-in-Package (SiP) product, which is designed using Cadence-SiP, and analyzed using Optimal SiP-enabled tool suite. A complete multi-level path, which consists of three portions-integrated circuit (IC), package and printed-circuit-board (PCB) -is selected as a test vehicle to investigate the limit of cascade-based approach. The results from quasi-static and full-wave simulation are compared, and the advantage of full-wave as well as limitation of quasi-static model are discussed. An innovative concept, referenced as "residual S-parameter", is proposed to characterize the coupling at the interface of IC, package and PCB, which plays an important role in the cascading of individual modules. Impact of the proposed concept on power integrity (PI) and signal integrity (SI) analysis is emphasized. Comparisons between full-wave, quasi-static and measurement results for representative component elements (interconnect, coupled bond wires) are discussed.
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