用于BEOL影响研究的精确3DIC热模拟

Han Yang, Bin Yan, Jianjun Sur, Jian Pang, Guanavao Li, Ouvana Keqing, Shuaiana Zhang
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引用次数: 0

摘要

本报告主要介绍2.5/3DIC系统高效准确的热分析。本报告不仅在系统层面进行了芯片、PCB、封装之间的热耦合,而且对特定热点区域进行了准确、详细的热分析。更重要的是,BEOL/RDL层对模具的结温有显著的影响,特别是在热点区域,这在工业和学术领域往往被忽视。因此,通过将BEOL/RDL层简化为金属密度,将BEOL/RDL层纳入热模拟。仿真结果表明,在稳态条件下,BEOL层对结温的影响较大,而在瞬态条件下,BEOL层对瞬态温升速率的影响较小。
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Accurate 3DIC thermal simulation for BEOL influence study
This present report mainly covers 2.5/3DIC system efficient and accurate thermal analysis. This report not only conducts the thermal coupling among dies, PCB, package at system level, but also performs accurate and detailed thermal analysis on specific hotspot regions. More importantly, the BEOL/RDL layer has a signicant impact on the juction temperature of the die, especially the hotspot region, which is often ignored in both industrial and academic area. Thus, the BEOL/RDL layer is incorporated into the thermal simulation by simplying the BEOL/RDL layer as the metal density. According to the simulation results, under steady-state conditions, the BEOL layer has a greater impact on the junction temperature, and under transient conditions, it has less impact on the transient temperature rise rate.
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