在各种环境和寿命测试中的记忆保留寿命

19th International Reliability Physics Symposium Pub Date : 1981-04-01 DOI:10.1109/IRPS.1981.362973

Masaaki Isagawa, Hideo Oniyama, Hideo Azegami

{"title":"在各种环境和寿命测试中的记忆保留寿命","authors":"Masaaki Isagawa, Hideo Oniyama, Hideo Azegami","doi":"10.1109/IRPS.1981.362973","DOIUrl":null,"url":null,"abstract":"The memory retention life and its repeatability was examined under conditions of high temperature storage, temperature cycling, bias operating, and high humidity, and after write/erase cycles for MNMoOS EAROMs having short memory retention life. It is shown that the high temperature storage and humidity tests are representative of all these tests, retention life during humidity tests for PED's is generally shorter than the unrecoverable failure life, and SiN overcoating extends retention life remarkably.","PeriodicalId":376954,"journal":{"name":"19th International Reliability Physics Symposium","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Memory Retention Life at Various Environmental and Life Tests\",\"authors\":\"Masaaki Isagawa, Hideo Oniyama, Hideo Azegami\",\"doi\":\"10.1109/IRPS.1981.362973\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The memory retention life and its repeatability was examined under conditions of high temperature storage, temperature cycling, bias operating, and high humidity, and after write/erase cycles for MNMoOS EAROMs having short memory retention life. It is shown that the high temperature storage and humidity tests are representative of all these tests, retention life during humidity tests for PED's is generally shorter than the unrecoverable failure life, and SiN overcoating extends retention life remarkably.\",\"PeriodicalId\":376954,\"journal\":{\"name\":\"19th International Reliability Physics Symposium\",\"volume\":\"2016 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1981-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"19th International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.1981.362973\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1981.362973","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在高温储存、温度循环、偏置操作和高湿条件下，以及经过写/擦除循环后，研究了记忆保留寿命短的MNMoOS EAROMs的记忆保留寿命及其可重复性。结果表明，高温贮藏和高湿试验具有代表性，PED在高湿试验中的滞留寿命普遍短于不可恢复失效寿命，而SiN涂层可显著延长滞留寿命。

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Memory Retention Life at Various Environmental and Life Tests

The memory retention life and its repeatability was examined under conditions of high temperature storage, temperature cycling, bias operating, and high humidity, and after write/erase cycles for MNMoOS EAROMs having short memory retention life. It is shown that the high temperature storage and humidity tests are representative of all these tests, retention life during humidity tests for PED's is generally shorter than the unrecoverable failure life, and SiN overcoating extends retention life remarkably.

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19th International Reliability Physics Symposium

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