开发背板测试和测量,以改善对现场模块加速暴露的相关性

T. Felder, W. Gambogi, J. Kopchick, Lucas Amspacher, R. Peacock, Benjamin Foltz, K. Stika, A. Bradley, B. Hamzavy, Bao-Ling Yu, L. Garreau-iles, O. Fu, Hongjie Hu, T. Trout
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引用次数: 11

摘要

将加速测试结果与现场观测相匹配是光伏行业的一个重要目标。我们继续开发测试方法来加强相关性。我们以前已经报道了加速试验和现场测量之间的FTIR光谱的良好相关性。便携式FTIR光谱仪的问世,使现场测量方便、可靠。最近,纳米压痕显示出与背板机械性能变化相关的希望。将形状精确的触针压入样品中,记录载荷与位移,并在无损测试中计算感兴趣的机械性能。该测试可以在全尺寸模块上进行,允许记录机械性能的区域变化。最后,我们将讨论光学轮廓术。在这种技术白光干涉图的表面是傅里叶变换,以产生一个三维图像。在几厘米的区域内可以检测到1纳米到5毫米的高度差。该技术可用于微型模块,并可用于确定裂纹和缺陷的尺寸。结果将提出相关的加速测试与现场模块涵盖光谱,机械和形态的变化。
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Development of backsheet tests and measurements to improve correlation of accelerated exposures to fielded modules
Matching accelerated test results to field observations is an important objective in the photovoltaic industry. We continue to develop test methods to strengthen correlations. We have previously reported good correlation of FTIR spectra between accelerated tests and field measurements. The availability of portable FTIR spectrometers has made measurement in the field convenient and reliable. Recently, nano-indentation has shown promise to correlate changes in backsheet mechanical properties. A precisely shaped stylus is pressed into a sample, load vs displacement recorded and mechanical properties of interest calculated in a nondestructive test. This test can be done on full size modules, allowing area variations in mechanical properties to be recorded. Finally, we will discuss optical profilometry. In this technique a white light interferogram of a surface is Fourier transformed to produce a three-dimensional image. Height differences from 1 nm to 5 mm can be detected over an area of a few cm. This technique can be used on minimodules, and is useful to determine crack and defect dimensions. Results will be presented correlating accelerated tests with fielded modules covering spectroscopic, mechanical, and morphological changes.
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