既然有缺陷的芯片更好,为什么还要设计可靠的芯片呢

K. Palem, L. Avinash, C. Enz, C. Piguet
{"title":"既然有缺陷的芯片更好,为什么还要设计可靠的芯片呢","authors":"K. Palem, L. Avinash, C. Enz, C. Piguet","doi":"10.1109/ESSCIRC.2013.6649121","DOIUrl":null,"url":null,"abstract":"Moore's law, the driving force behind the computing technology revolution is widely expected to face limiting, if not disruptive, hurdles within the next 5 years or so, owing in part to its inability to cope with the errors arising from device variations and perturbations as well as the accompanying increased power density in deep nanoscale CMOS regime. To overcome these twin hurdles and in a sharp contrast to that of conventional research based on von Neumann's legacy of designing reliable hardware from unreliable components, we adopt a radically different philosophy of designing unreliable hardware from reliable or unreliable components, wherein we take advantage of the inherent- or induced- errors in the circuits to achieve significant cost (in terms of size, energy, design, performance, manufacturing and verification) savings. Our approach not only is sensitive to the value of information, thereby producing good enough designs of lesser cost but also opens an entirely new design space where perceptual- and statistical-limitations (and hence, the desired quality) is a dimension that can be traded off.","PeriodicalId":183620,"journal":{"name":"2013 Proceedings of the ESSCIRC (ESSCIRC)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Why design reliable chips when faulty ones are even better\",\"authors\":\"K. Palem, L. Avinash, C. Enz, C. Piguet\",\"doi\":\"10.1109/ESSCIRC.2013.6649121\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Moore's law, the driving force behind the computing technology revolution is widely expected to face limiting, if not disruptive, hurdles within the next 5 years or so, owing in part to its inability to cope with the errors arising from device variations and perturbations as well as the accompanying increased power density in deep nanoscale CMOS regime. To overcome these twin hurdles and in a sharp contrast to that of conventional research based on von Neumann's legacy of designing reliable hardware from unreliable components, we adopt a radically different philosophy of designing unreliable hardware from reliable or unreliable components, wherein we take advantage of the inherent- or induced- errors in the circuits to achieve significant cost (in terms of size, energy, design, performance, manufacturing and verification) savings. Our approach not only is sensitive to the value of information, thereby producing good enough designs of lesser cost but also opens an entirely new design space where perceptual- and statistical-limitations (and hence, the desired quality) is a dimension that can be traded off.\",\"PeriodicalId\":183620,\"journal\":{\"name\":\"2013 Proceedings of the ESSCIRC (ESSCIRC)\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 Proceedings of the ESSCIRC (ESSCIRC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.2013.6649121\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Proceedings of the ESSCIRC (ESSCIRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.2013.6649121","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

人们普遍预计,计算技术革命背后的驱动力摩尔定律在未来5年左右将面临限制,如果不是破坏性的障碍,部分原因是它无法应对由器件变化和扰动引起的误差,以及伴随而来的深度纳米级CMOS功率密度的增加。为了克服这些双重障碍,并与基于冯·诺伊曼从不可靠的组件设计可靠硬件的传统研究形成鲜明对比,我们采用了一种完全不同的理念,从可靠或不可靠的组件设计不可靠的硬件,其中我们利用电路中固有的或诱发的错误来实现显著的成本节约(在尺寸,能源,设计,性能,制造和验证方面)。我们的方法不仅对信息的价值敏感,从而以更低的成本生产足够好的设计,而且还开辟了一个全新的设计空间,在这个空间中,感知和统计限制(因此,期望的质量)是一个可以权衡的维度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Why design reliable chips when faulty ones are even better
Moore's law, the driving force behind the computing technology revolution is widely expected to face limiting, if not disruptive, hurdles within the next 5 years or so, owing in part to its inability to cope with the errors arising from device variations and perturbations as well as the accompanying increased power density in deep nanoscale CMOS regime. To overcome these twin hurdles and in a sharp contrast to that of conventional research based on von Neumann's legacy of designing reliable hardware from unreliable components, we adopt a radically different philosophy of designing unreliable hardware from reliable or unreliable components, wherein we take advantage of the inherent- or induced- errors in the circuits to achieve significant cost (in terms of size, energy, design, performance, manufacturing and verification) savings. Our approach not only is sensitive to the value of information, thereby producing good enough designs of lesser cost but also opens an entirely new design space where perceptual- and statistical-limitations (and hence, the desired quality) is a dimension that can be traded off.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A 180nm fully-integrated dual-channel reconfigurable receiver for GNSS interoperations A 40 nm LP CMOS self-biased continuous-time comparator with sub-100ps delay at 1.1V & 1.2mW MEMS for automotive and consumer electronics A resistor-based temperature sensor for MEMS frequency references A 13.2% locking-range divide-by-6, 3.1mW, ILFD using even-harmonic-enhanced direct injection technique for millimeter-wave PLLs
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1