{"title":"对空军航空电子设备集成电路制造设计和装配缺陷进行了综述","authors":"T. Green","doi":"10.1109/RELPHY.1988.23454","DOIUrl":null,"url":null,"abstract":"In 1986, Rome Air Development Center (RADC) initiated a microcircuit and hybrid field return and failure analysis program. Data from that program along with case studies from each of the three major failure categories are presented. Emphasis is placed on microcircuit failures that were the result of design, fabrication and assembly defects. The purpose of the RADC work is to lay the groundwork for a US Department of Defense parts return and failure analysis program and to demonstrate the importance of analyzing field failures.<<ETX>>","PeriodicalId":102187,"journal":{"name":"26th Annual Proceedings Reliability Physics Symposium 1988","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-04-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A review of IC fabrication design and assembly defects manifested as field failures in Air Force avionic equipment\",\"authors\":\"T. Green\",\"doi\":\"10.1109/RELPHY.1988.23454\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In 1986, Rome Air Development Center (RADC) initiated a microcircuit and hybrid field return and failure analysis program. Data from that program along with case studies from each of the three major failure categories are presented. Emphasis is placed on microcircuit failures that were the result of design, fabrication and assembly defects. The purpose of the RADC work is to lay the groundwork for a US Department of Defense parts return and failure analysis program and to demonstrate the importance of analyzing field failures.<<ETX>>\",\"PeriodicalId\":102187,\"journal\":{\"name\":\"26th Annual Proceedings Reliability Physics Symposium 1988\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-04-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"26th Annual Proceedings Reliability Physics Symposium 1988\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RELPHY.1988.23454\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"26th Annual Proceedings Reliability Physics Symposium 1988","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RELPHY.1988.23454","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A review of IC fabrication design and assembly defects manifested as field failures in Air Force avionic equipment
In 1986, Rome Air Development Center (RADC) initiated a microcircuit and hybrid field return and failure analysis program. Data from that program along with case studies from each of the three major failure categories are presented. Emphasis is placed on microcircuit failures that were the result of design, fabrication and assembly defects. The purpose of the RADC work is to lay the groundwork for a US Department of Defense parts return and failure analysis program and to demonstrate the importance of analyzing field failures.<>