正色调i线光刻胶与控制下切轮廓先进的包装

Walter Liu, C. Chen, PingHung Lu, S. Lai, Y. Sakurai
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引用次数: 0

摘要

随着先进封装技术的发展,RDL金属线和μBump的稳定性和超电性能受到了人们的高度关注。为了获得RDL金属线和有立脚的μBump,需要带下切轮廓的光刻胶。AZ®3DT-400系列配方是EMD Electronics开发的化学放大正色调i线光刻胶,其中引入了一种特殊添加剂来产生凹边轮廓。凹边的大小和形状可随添加剂的添加量而调整。优化配方后,获得了大于目标CD 10%的侧切长度和小于目标CD 10%的侧切高度。
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Positive tone i-line photoresist with controlled undercut profile for advanced packaging
With the progress of advanced packaging, the RDL metal line and μBump stability and super electrical performance were highly concerned. The photoresist with undercut profile is required to obtain the RDL metal line and μBump with footing. The AZ® 3DT-400 series formulation is a chemically amplified positive-tone i-line photoresist developed by EMD Electronics which a special additive was introduced to generate the undercut profile. The undercut size and shape can be adjusted with the loading of the additive. After optimizing the formulation, the desired undercut length larger than 10% of the target CD and the undercut height less than 10% of target CD were achieved.
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