{"title":"基于最小二乘支持向量机的模拟集成电路性能建模","authors":"T. Kiely, G. Gielen","doi":"10.1109/DATE.2004.1268887","DOIUrl":null,"url":null,"abstract":"This paper describes the application of least-squares support vector machine (LS-SVM) training to analog circuit performance modeling as needed for accelerated or hierarchical analog circuit synthesis. The training is a type of regression, where a function of a special form is fit to experimental performance data derived from analog circuit simulations. The method is contrasted with a feasibility model approach based on the more traditional use of SVMs, namely classification. A design of experiments (DOE) strategy is reviewed which forms the basis of an efficient simulation sampling scheme. The results of our functional regression are then compared to two other DOE-based fitting schemes: a simple linear least-squares regression and a regression using posynomial models. The LS-SVM fitting has advantages over these approaches in terms of accuracy of fit to measured data, prediction of intermediate data points and reduction of free model tuning parameters.","PeriodicalId":335658,"journal":{"name":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"81","resultStr":"{\"title\":\"Performance modeling of analog integrated circuits using least-squares support vector machines\",\"authors\":\"T. Kiely, G. Gielen\",\"doi\":\"10.1109/DATE.2004.1268887\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the application of least-squares support vector machine (LS-SVM) training to analog circuit performance modeling as needed for accelerated or hierarchical analog circuit synthesis. The training is a type of regression, where a function of a special form is fit to experimental performance data derived from analog circuit simulations. The method is contrasted with a feasibility model approach based on the more traditional use of SVMs, namely classification. A design of experiments (DOE) strategy is reviewed which forms the basis of an efficient simulation sampling scheme. The results of our functional regression are then compared to two other DOE-based fitting schemes: a simple linear least-squares regression and a regression using posynomial models. The LS-SVM fitting has advantages over these approaches in terms of accuracy of fit to measured data, prediction of intermediate data points and reduction of free model tuning parameters.\",\"PeriodicalId\":335658,\"journal\":{\"name\":\"Proceedings Design, Automation and Test in Europe Conference and Exhibition\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-02-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"81\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Design, Automation and Test in Europe Conference and Exhibition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DATE.2004.1268887\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Design, Automation and Test in Europe Conference and Exhibition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DATE.2004.1268887","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Performance modeling of analog integrated circuits using least-squares support vector machines
This paper describes the application of least-squares support vector machine (LS-SVM) training to analog circuit performance modeling as needed for accelerated or hierarchical analog circuit synthesis. The training is a type of regression, where a function of a special form is fit to experimental performance data derived from analog circuit simulations. The method is contrasted with a feasibility model approach based on the more traditional use of SVMs, namely classification. A design of experiments (DOE) strategy is reviewed which forms the basis of an efficient simulation sampling scheme. The results of our functional regression are then compared to two other DOE-based fitting schemes: a simple linear least-squares regression and a regression using posynomial models. The LS-SVM fitting has advantages over these approaches in terms of accuracy of fit to measured data, prediction of intermediate data points and reduction of free model tuning parameters.