一种基于预存储测试的内置自检方法

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI:10.1109/VTEST.1993.313315

G. Edirisooriya, S. Edirisooriya, John P. Robinson

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引用次数: 3

摘要

内置自检(BIST)方案提供片上电路来生成测试向量并分析输出响应，从而可以在不使用昂贵的外部测试器的情况下进行测试。作者提出了一种统一的测试模式生成和输出压缩的方法。用ISCAS基准电路验证了所提方法的适用性。

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A new built-in self-test method based on prestored testing

Built-in-self-test (BIST) schemes provide on-chip circuitry to generate test vectors and to analyze output responses so that testing can be performed without using expensive external testers. The authors present a unified approach to test pattern generation and output compaction. ISCAS benchmark circuits are used to show the applicability of the proposed method.<>

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Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium

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