单壁碳纳米管束辐射损伤的积累与恢复

I. Uvarova, R. Rudenko, E. A. Voitsihovska, I. Yaskovets, B. Danilchenko
{"title":"单壁碳纳米管束辐射损伤的积累与恢复","authors":"I. Uvarova, R. Rudenko, E. A. Voitsihovska, I. Yaskovets, B. Danilchenko","doi":"10.1109/ISSE.2014.6887628","DOIUrl":null,"url":null,"abstract":"In presented study we investigate the influence of electron irradiation, with energy of incident electrons 1 MeV, on the electrical resistance of single-walled carbon nanotube bundles. Irradiation was performed at liquid helium temperature for the first time. To determine radiation-induced damages accumulation and its further thermal recovering, the samples resistance was in situ measured in wide temperature range (5-300 K). The results reveal radiation damage annealing at temperature ~ 200 K that we associate with formation of inter-tube links in the bundles.","PeriodicalId":375711,"journal":{"name":"Proceedings of the 2014 37th International Spring Seminar on Electronics Technology","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Accumulation and recovery of radiation-induced damages in single-walled carbon nanotube bundles\",\"authors\":\"I. Uvarova, R. Rudenko, E. A. Voitsihovska, I. Yaskovets, B. Danilchenko\",\"doi\":\"10.1109/ISSE.2014.6887628\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In presented study we investigate the influence of electron irradiation, with energy of incident electrons 1 MeV, on the electrical resistance of single-walled carbon nanotube bundles. Irradiation was performed at liquid helium temperature for the first time. To determine radiation-induced damages accumulation and its further thermal recovering, the samples resistance was in situ measured in wide temperature range (5-300 K). The results reveal radiation damage annealing at temperature ~ 200 K that we associate with formation of inter-tube links in the bundles.\",\"PeriodicalId\":375711,\"journal\":{\"name\":\"Proceedings of the 2014 37th International Spring Seminar on Electronics Technology\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2014 37th International Spring Seminar on Electronics Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSE.2014.6887628\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2014 37th International Spring Seminar on Electronics Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSE.2014.6887628","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

在本研究中,我们研究了入射电子能量为1 MeV的电子辐照对单壁碳纳米管束电阻的影响。首次在液氦温度下进行辐照。为了确定辐射损伤积累及其进一步的热恢复,在宽温度范围内(5-300 K)原位测量了样品的电阻。结果表明,在~ 200 K的温度下,辐射损伤退火与管束中管间连接的形成有关。
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Accumulation and recovery of radiation-induced damages in single-walled carbon nanotube bundles
In presented study we investigate the influence of electron irradiation, with energy of incident electrons 1 MeV, on the electrical resistance of single-walled carbon nanotube bundles. Irradiation was performed at liquid helium temperature for the first time. To determine radiation-induced damages accumulation and its further thermal recovering, the samples resistance was in situ measured in wide temperature range (5-300 K). The results reveal radiation damage annealing at temperature ~ 200 K that we associate with formation of inter-tube links in the bundles.
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