{"title":"具有75 dB SFDR的0.9 V 9 mW 1MSPS数字校准ADC","authors":"D. Chang, G. Ahn, U. Moon","doi":"10.1109/VLSIC.2003.1221164","DOIUrl":null,"url":null,"abstract":"A low-voltage two-stage algorithmic ADC incorporating the Opamp-Reset Switching Technique (ORST) is presented. The low-voltage digital CMOS process compatible operation is achieved without the clock boosting/bootstrapping or switched-opamp. The ADC employs a highly linear input sampling circuit at the front-end, and the digital output is calibrated using a radix-based scheme. The prototype was fabricated in a 0.18-/spl mu/m CMOS technology and the active die area is 1.2 mm/spl times/1.2 mm. The calibrated ADC demonstrates 75 dB SFDR at 0.9 V and 80 dB SFDR at 1.2 V. The total power consumption of the ADC is 9 mW at the clock frequency of 7 MHz (1MSPS).","PeriodicalId":270304,"journal":{"name":"2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"A 0.9 V 9 mW 1MSPS digitally calibrated ADC with 75 dB SFDR\",\"authors\":\"D. Chang, G. Ahn, U. Moon\",\"doi\":\"10.1109/VLSIC.2003.1221164\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A low-voltage two-stage algorithmic ADC incorporating the Opamp-Reset Switching Technique (ORST) is presented. The low-voltage digital CMOS process compatible operation is achieved without the clock boosting/bootstrapping or switched-opamp. The ADC employs a highly linear input sampling circuit at the front-end, and the digital output is calibrated using a radix-based scheme. The prototype was fabricated in a 0.18-/spl mu/m CMOS technology and the active die area is 1.2 mm/spl times/1.2 mm. The calibrated ADC demonstrates 75 dB SFDR at 0.9 V and 80 dB SFDR at 1.2 V. The total power consumption of the ADC is 9 mW at the clock frequency of 7 MHz (1MSPS).\",\"PeriodicalId\":270304,\"journal\":{\"name\":\"2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2003.1221164\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2003.1221164","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 0.9 V 9 mW 1MSPS digitally calibrated ADC with 75 dB SFDR
A low-voltage two-stage algorithmic ADC incorporating the Opamp-Reset Switching Technique (ORST) is presented. The low-voltage digital CMOS process compatible operation is achieved without the clock boosting/bootstrapping or switched-opamp. The ADC employs a highly linear input sampling circuit at the front-end, and the digital output is calibrated using a radix-based scheme. The prototype was fabricated in a 0.18-/spl mu/m CMOS technology and the active die area is 1.2 mm/spl times/1.2 mm. The calibrated ADC demonstrates 75 dB SFDR at 0.9 V and 80 dB SFDR at 1.2 V. The total power consumption of the ADC is 9 mW at the clock frequency of 7 MHz (1MSPS).