H注入ZnO的结构和光学性质

K. S. Chan, J. Ye, P. Parkinson, E. Monakhov, K. M. Johansen, L. Vines, B. Svensson, C. Jagadish, J. Wong-Leung
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引用次数: 1

摘要

ZnO是一种宽禁带半导体,在制造工作在紫外区的光电器件方面具有巨大的潜力。然而,仍然不可能实现p型ZnO,氢被认为是一个浅层供体,对生长ZnO的n型电导率有显著贡献。为了实现p型掺杂,需要更好地了解H在ZnO中的作用。在这项研究中,我们利用多种结构和光学技术来研究H注入ZnO所引起的影响。采用x射线衍射、光致发光光谱、二次离子质谱和透射电子显微镜对单晶ZnO衬底中的H注入区进行了表征。XRD结果表明,H注入形成了变形层,应变随注入剂量线性增加。在H注入ZnO的紫外光致发光中也观察到蓝移现象。
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Structural and optical properties of H implanted ZnO
ZnO is a wide bandgap semiconductor with huge potential to fabricate optoelectronic devices operating in the UV region. However, it is still not possible to achieve p-type ZnO, with hydrogen suggested to be a shallow donor that contributes significantly to the n-type conductivity in as grown ZnO. A better understanding on the role of H in ZnO is needed to realise p-type doping in ZnO. In this research, we utilised multiple structural and optical techniques to study the effects caused by H implantation in ZnO. The H implanted region in single crystal ZnO substrate was characterised by X-Ray diffraction, photoluminescence spectroscopy, secondary ion mass spectroscopy and transmission electron microscopy. XRD results show that H implantation created deformed layers with strain increasing linearly with implantation dose. A blue shift is also observed from the UV photoluminescence emission of the H implanted ZnO.
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