Ruan Xiaofen, Zhang Xijun, Wu Zhancheng, W. Shuping
{"title":"两种商用ESD模拟器的研究","authors":"Ruan Xiaofen, Zhang Xijun, Wu Zhancheng, W. Shuping","doi":"10.1109/CEEM.2003.237921","DOIUrl":null,"url":null,"abstract":"In this paper, the performances of two types of ESD simulators (ESS-200AX made in Noiseken and NSG435 made in Schaffner) are studied, and ESD immunity experiments of a single chip microcomputer (SCM) system are made. The experimental results show that the differences between two simulators yield inconsistent test results though they both comply with the IEC61000-4-2 ESD standard. Therefore, besides the ESD current waveform, the relevant IEC61000-4-2 ESD standard should specify the discharge current derivative, related electromagnetic field in detail, and give unified specifications for the construction and configuration of ESD simulators.","PeriodicalId":129734,"journal":{"name":"Asia-Pacific Conference on Environmental Electromagnetics, 2003. CEEM 2003. Proceedings.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Study on two types of commercial ESD simulators\",\"authors\":\"Ruan Xiaofen, Zhang Xijun, Wu Zhancheng, W. Shuping\",\"doi\":\"10.1109/CEEM.2003.237921\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the performances of two types of ESD simulators (ESS-200AX made in Noiseken and NSG435 made in Schaffner) are studied, and ESD immunity experiments of a single chip microcomputer (SCM) system are made. The experimental results show that the differences between two simulators yield inconsistent test results though they both comply with the IEC61000-4-2 ESD standard. Therefore, besides the ESD current waveform, the relevant IEC61000-4-2 ESD standard should specify the discharge current derivative, related electromagnetic field in detail, and give unified specifications for the construction and configuration of ESD simulators.\",\"PeriodicalId\":129734,\"journal\":{\"name\":\"Asia-Pacific Conference on Environmental Electromagnetics, 2003. CEEM 2003. Proceedings.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Asia-Pacific Conference on Environmental Electromagnetics, 2003. CEEM 2003. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEEM.2003.237921\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Asia-Pacific Conference on Environmental Electromagnetics, 2003. CEEM 2003. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEEM.2003.237921","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, the performances of two types of ESD simulators (ESS-200AX made in Noiseken and NSG435 made in Schaffner) are studied, and ESD immunity experiments of a single chip microcomputer (SCM) system are made. The experimental results show that the differences between two simulators yield inconsistent test results though they both comply with the IEC61000-4-2 ESD standard. Therefore, besides the ESD current waveform, the relevant IEC61000-4-2 ESD standard should specify the discharge current derivative, related electromagnetic field in detail, and give unified specifications for the construction and configuration of ESD simulators.
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