用于减少快闪记忆体储存系统磨损的保留修整

Liang Shi, Kaijie Wu, Mengying Zhao, C. Xue, E. Sha
{"title":"用于减少快闪记忆体储存系统磨损的保留修整","authors":"Liang Shi, Kaijie Wu, Mengying Zhao, C. Xue, E. Sha","doi":"10.1145/2593069.2593203","DOIUrl":null,"url":null,"abstract":"NAND flash memory has been widely applied in embedded systems, personal computer systems, and data centers. However, with the development of flash memory, including its technology scaling and density improvement, the endurance of flash memory becomes a bottleneck. In this work, with the understanding of the relationship between data retention time and flash wearing, a retention trimming approach, which trims data retention time based on the time intervals between data updating, is proposed to reduce the wearing of flash memory. Reduced wearing of flash memory will improve the endurance of the flash memory. Extensive experimental results show that the proposed technique achieves significant wearing reduction for flash memory through retention trimming.","PeriodicalId":433816,"journal":{"name":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"301 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Retention trimming for wear reduction of flash memory storage systems\",\"authors\":\"Liang Shi, Kaijie Wu, Mengying Zhao, C. Xue, E. Sha\",\"doi\":\"10.1145/2593069.2593203\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"NAND flash memory has been widely applied in embedded systems, personal computer systems, and data centers. However, with the development of flash memory, including its technology scaling and density improvement, the endurance of flash memory becomes a bottleneck. In this work, with the understanding of the relationship between data retention time and flash wearing, a retention trimming approach, which trims data retention time based on the time intervals between data updating, is proposed to reduce the wearing of flash memory. Reduced wearing of flash memory will improve the endurance of the flash memory. Extensive experimental results show that the proposed technique achieves significant wearing reduction for flash memory through retention trimming.\",\"PeriodicalId\":433816,\"journal\":{\"name\":\"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"volume\":\"301 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2593069.2593203\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2593069.2593203","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

摘要

NAND闪存已广泛应用于嵌入式系统、个人计算机系统和数据中心。然而,随着闪存的发展,包括其技术的规模化和密度的提高,闪存的耐用性成为瓶颈。本文在了解数据保留时间与闪存磨损之间关系的基础上,提出了一种基于数据更新时间间隔来调整数据保留时间的方法,以减少闪存的磨损。减少闪存的磨损将提高闪存的耐用性。大量的实验结果表明,该技术通过保留修剪可以显著降低闪存的磨损。
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Retention trimming for wear reduction of flash memory storage systems
NAND flash memory has been widely applied in embedded systems, personal computer systems, and data centers. However, with the development of flash memory, including its technology scaling and density improvement, the endurance of flash memory becomes a bottleneck. In this work, with the understanding of the relationship between data retention time and flash wearing, a retention trimming approach, which trims data retention time based on the time intervals between data updating, is proposed to reduce the wearing of flash memory. Reduced wearing of flash memory will improve the endurance of the flash memory. Extensive experimental results show that the proposed technique achieves significant wearing reduction for flash memory through retention trimming.
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