微电子封装应用中环保互连材料的新型纳米技术

Yi Li, K. Moon, C. Wong
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引用次数: 1

摘要

最近,各向异性导电胶粘剂(ACAs)作为环保材料在电子封装行业引起了越来越多的兴趣,因为它们是无铅的,需要更少的加工步骤,如助焊剂和清洁(降低加工成本),允许低加工温度(允许使用热敏和低成本的组件和基板),以及细间距互连能力(使电子设备小型化)。在本研究中,首次研究了纳米银(Ag)颗粒对ACA配方电性能的影响。研究发现,纳米银(Ag)颗粒在明显低于熔点(Ag的Tm为960℃)的温度下(<200℃)表现出烧结行为。烧结后的纳米Ag粒子显著降低了ACA的接头电阻,增强了ACAs的载流能力。此外,采用自组装单层(SAMs)的新方法处理纳米Ag填料,以改善ACA接头的界面性能。这些经过sam处理的ACAs在ACA样品的加工温度下具有热稳定性。通过将新型的SAM材料引入到纳米金属填料与衬底键合垫之间的界面中,由于纳米填料与SAM之间的键合更强,进一步提高了ACAs的导电性和载流能力,从而改善了高性能ACA的界面性能,具有潜在的微处理器应用前景。这一改进使得在电子工业中取代含铅焊料互连成为可能。
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Novel nanotechnology for environmentally friendly interconnect materials in microelectronic packaging applications
Recently, anisotropic conductive adhesives (ACAs) have attracted increasing interests as environmentally friendly materials in electronic packaging industry because they are lead-free, require fewer processing steps, such as fluxing and cleaning (reducing processing cost), allow a low processing temperature (enabling the use of heat-sensitive and low-cost components and substrates), and fine pitch interconnect capability (enabling the miniaturization of electronic devices). In this study, effects of nano silver (Ag) particles on electrical properties of ACA formulations were firstly investigated. It is discovered that nano silver (Ag) particles exhibited sintering behavior at significantly lower temperatures (<200°C) than the melting point (Tm of Ag is 960°C). The sintered nano Ag particles significantly reduced the ACA joint resistance and enhanced the current carrying capability of ACAs. In addition, a novel approach of self-assembled monolayers (SAMs) was used to treat nano Ag fillers to improve the interface properties of ACA joints. These SAM-treated ACAs were thermally stable at processing temperatures of the ACA samples. By introducing the novel SAM materials into the interfaces between nano metal fillers and the substrate bond pads, the conductivity and current carrying capability of ACAs were further improved due to the stronger bonding between nano fillers and SAM and consequently, it improved interface properties of the high performance ACA for potential microprocessor applications. This improvement enabled the possibility of replacing lead-containing solder interconnects in electronic industry.
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