{"title":"什么是IEEE P1149.8.1，为什么?","authors":"K. Parker, J. Burgess","doi":"10.1109/TEST.2009.5355837","DOIUrl":null,"url":null,"abstract":"This poster will provide a high-level description of IEEE P1149.8.1 and the manufacturing board test problem set it addresses. The poster will serve as a follow on to a paper (Session 2.1) which will be presented earlier in the conference. The principal goal of the poster is to raise awareness (and participation) for the developing standard.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"What is IEEE P1149.8.1 and why?\",\"authors\":\"K. Parker, J. Burgess\",\"doi\":\"10.1109/TEST.2009.5355837\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This poster will provide a high-level description of IEEE P1149.8.1 and the manufacturing board test problem set it addresses. The poster will serve as a follow on to a paper (Session 2.1) which will be presented earlier in the conference. The principal goal of the poster is to raise awareness (and participation) for the developing standard.\",\"PeriodicalId\":419063,\"journal\":{\"name\":\"2009 International Test Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2009.5355837\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355837","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This poster will provide a high-level description of IEEE P1149.8.1 and the manufacturing board test problem set it addresses. The poster will serve as a follow on to a paper (Session 2.1) which will be presented earlier in the conference. The principal goal of the poster is to raise awareness (and participation) for the developing standard.
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