离子束辐照ZnO纳米线的电学和光学特性

Caroline I. Lisevski, A. L. F. Cauduro, P. Franzen, H. Boudinov, D. L. Baptista
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引用次数: 0

摘要

氧化锌纳米线因其在电子和光电子器件中的潜在应用而引起了人们的广泛关注。本文报道了气-液-固法生长的氧化锌纳米线在不同剂量的1.2 MeV He+离子照射下的光致发光和电学行为。结果表明,在低通量辐照过程中,存在增强的动态退火效应,使其能够愈合低迁移势垒点缺陷,如氧间隙(OI)、锌间隙(ZnI)、锌对位(ZnO)和氧对位(OZn)。另一方面,具有较高迁移势垒能的高度稳定缺陷,如氧空位(VO),似乎更加明显,导致1.7 eV的短红外发射。
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Electrical and optical behavior of ZnO nanowires irradiated by ion beam
Zinc oxide nanowires have been attracting much interest due to their potential use in electronics and optoelectonics devices. In this work, we report on the photoluminescence and electrical behavior of ZnO nanowires grown by vapor-liquid-solid method and irradiated with 1.2 MeV He+ ions at several doses. The results strongly indicates the existence of an enhanced dynamic annealing effect during the low fluence irradiations allowing it to heal low migration barrier point-defects such as oxygen interstitials (OI), zinc interstitials (ZnI), zinc antisites (ZnO) and oxygen antisites (OZn). On the other hand, highly stable defects such as oxygen vacancies (VO), which present higher migration barrier energy, seems to be more pronounced giving rise to short-infrared emission at 1.7 eV.
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