{"title":"热点话题二:发展与工业化","authors":"M. Riffiod, P. Caspi, C. Piala, J. Voirin","doi":"10.1109/DATE.2007.364494","DOIUrl":null,"url":null,"abstract":"This second technical session illustrates the methodological dimensions of technology transfer. It elaborates on some methodologies deployed in critical steps of the whole embedded systems development process, particularly to specify safety critical embedded systems, to manage obsolescence of components and to certify the airworthiness of the final solutions","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"73 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Hot Topic 2: Development and Industrialisation\",\"authors\":\"M. Riffiod, P. Caspi, C. Piala, J. Voirin\",\"doi\":\"10.1109/DATE.2007.364494\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This second technical session illustrates the methodological dimensions of technology transfer. It elaborates on some methodologies deployed in critical steps of the whole embedded systems development process, particularly to specify safety critical embedded systems, to manage obsolescence of components and to certify the airworthiness of the final solutions\",\"PeriodicalId\":298961,\"journal\":{\"name\":\"2007 Design, Automation & Test in Europe Conference & Exhibition\",\"volume\":\"73 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-04-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 Design, Automation & Test in Europe Conference & Exhibition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DATE.2007.364494\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Design, Automation & Test in Europe Conference & Exhibition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DATE.2007.364494","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This second technical session illustrates the methodological dimensions of technology transfer. It elaborates on some methodologies deployed in critical steps of the whole embedded systems development process, particularly to specify safety critical embedded systems, to manage obsolescence of components and to certify the airworthiness of the final solutions