基于散射参数测量的共面波导建模

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem Pub Date : 1900-01-01 DOI:10.1109/ASDAM.2002.1088516

M. Klasovitý, M. Tomáška

{"title":"基于散射参数测量的共面波导建模","authors":"M. Klasovitý, M. Tomáška","doi":"10.1109/ASDAM.2002.1088516","DOIUrl":null,"url":null,"abstract":"Presents a method for verification of important coplanar waveguide parameters. It employs a simplex optimization algorithm for transmission line model identification from on-wafer S-parameter measurements in a wide frequency range. The method was implemented in a control program for automated S-parameter measurements and applied for characterization of micromachined AlGaAs and InGaP coplanar waveguides.","PeriodicalId":179900,"journal":{"name":"The Fourth International Conference on Advanced Semiconductor Devices and Microsystem","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Coplanar waveguide modeling based on scattering parameter measurements\",\"authors\":\"M. Klasovitý, M. Tomáška\",\"doi\":\"10.1109/ASDAM.2002.1088516\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presents a method for verification of important coplanar waveguide parameters. It employs a simplex optimization algorithm for transmission line model identification from on-wafer S-parameter measurements in a wide frequency range. The method was implemented in a control program for automated S-parameter measurements and applied for characterization of micromachined AlGaAs and InGaP coplanar waveguides.\",\"PeriodicalId\":179900,\"journal\":{\"name\":\"The Fourth International Conference on Advanced Semiconductor Devices and Microsystem\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Fourth International Conference on Advanced Semiconductor Devices and Microsystem\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASDAM.2002.1088516\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Fourth International Conference on Advanced Semiconductor Devices and Microsystem","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM.2002.1088516","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

提出了一种验证共面波导重要参数的方法。采用单纯形优化算法对宽频率范围内晶片s参数测量的传输线模型进行识别。该方法在自动s参数测量控制程序中实现，并应用于微加工AlGaAs和InGaP共面波导的表征。

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Coplanar waveguide modeling based on scattering parameter measurements

Presents a method for verification of important coplanar waveguide parameters. It employs a simplex optimization algorithm for transmission line model identification from on-wafer S-parameter measurements in a wide frequency range. The method was implemented in a control program for automated S-parameter measurements and applied for characterization of micromachined AlGaAs and InGaP coplanar waveguides.

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The Fourth International Conference on Advanced Semiconductor Devices and Microsystem

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