{"title":"用电容测量法测定涂层的厚度和介电常数","authors":"A. Guadanama-Santana, A. García-Valenzuela","doi":"10.1109/MIM.2007.4343564","DOIUrl":null,"url":null,"abstract":"We show it is possible to measure both the dielectric constant and thickness of dielectric coating on a flat conducting substrate from two capacitance measurements. We discuss the principles of measurement, present numerical simulations, and a proof of principle experiment","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Determination of thickness and dielectric constant of coatings from capacitance measurements\",\"authors\":\"A. Guadanama-Santana, A. García-Valenzuela\",\"doi\":\"10.1109/MIM.2007.4343564\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We show it is possible to measure both the dielectric constant and thickness of dielectric coating on a flat conducting substrate from two capacitance measurements. We discuss the principles of measurement, present numerical simulations, and a proof of principle experiment\",\"PeriodicalId\":244878,\"journal\":{\"name\":\"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIM.2007.4343564\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIM.2007.4343564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determination of thickness and dielectric constant of coatings from capacitance measurements
We show it is possible to measure both the dielectric constant and thickness of dielectric coating on a flat conducting substrate from two capacitance measurements. We discuss the principles of measurement, present numerical simulations, and a proof of principle experiment
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