不同热载荷和热机械载荷条件下焊点可靠性分析:以汽车ecu为例

Abdalla Youssef, I. Birner, Holger Voelkel, J. Thierauf, Robert Vodiunig, A. Middendorf, K. Lang
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引用次数: 4

摘要

汽车工业中的电子控制单元(ecu)暴露在极端恶劣的电气和物理工作条件下。此外,由于汽车工业的不断创新,这些系统的复杂性和小型化程度越来越高。除了环境因素外,随着“电动汽车”的发展,汽车行业对电子元件的可靠性也提出了新的要求。这些新的充电要求增加了相关ecu的工作时间。除此之外,可靠性作为一个定义是设备在使用寿命方面执行其设计功能的能力。此外,电子设备的内部散热增加,这是由于电动汽车要求所需的电子设备的功率密度增加造成的。一级互连技术是决定电子控制单元可靠性的重要因素之一;电子元件和印刷电路板之间的焊点。采用加速试验的方法,相对于实际使用寿命,以较快的速度将使用寿命内可能的失效机制可视化,从而获得可靠性信息。系统承受比正常工作条件下规定的更严重的压力水平。焊点的界面结构是决定焊点可靠性的主要因素。问题不仅是焊料和铜衬底之间的空洞形成,而且金属间化合物(IMCs)的形成和生长也是一个问题。这些化合物本质上是脆性材料,当受到机械或热机械载荷时,可能会开裂和断裂,导致可能的电气或过热故障。为了了解环境负载条件下决定电子控制单元可靠性的控制因素,利用工业电子模块进行了实验设计。在不同的设计应力条件下,这些模块在主动模式下受力。失效分析遵循老化过程,包括功能测试、金相学和显微检查。讨论了不同应力条件下界面结构的演变及焊点的力学可靠性。基于本研究的观察结果,对不同环境胁迫条件下的衰老机制有了更深入的了解。结果表明,焊点的失效机制比其他元件的失效机制更占优势。观察到在热和热机械载荷下焊点的imc生长,空洞和开裂,这可能导致电气故障或过热而导致故障。
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Reliability analysis of solder joints under different thermal and thermo-mechanical loading conditions: Case study of automotive ECUs
Electronic control units (ECUs) in automotive industry are exposed to extreme harsh electrical and physical working conditions. Moreover, due to the continuous innovation in automotive industry, complexity and miniaturization of these systems are increasing. Beside the environmental factors, there are other new requirements facing the electronic components reliability in automotive industry accompanied by `electromobility'. These new requirements represented in charging have increased the operating time of the involved ECUs. In addition to that, Reliability as a definition is the ability of the device to perform its designed function in terms of years of useful lifetime. Furthermore, internal heat dissipation of electronic devices is increased which is caused by increased power densities of electronic devices needed for electromobility requirements. One of the governing factors determining the reliability of electronic control units are first level interconnect technologies; solder joints between electronic components and the printed circuit board. Accelerated testing experiments are used to obtain reliability information by visualizing the possible failure mechanisms during the useful lifetime relatively quick compared to the actual useful lifetime. Systems are subjected to more severe stress levels than those specified in the normal operating conditions. Interfacial structure of solder joints is a main factor determining solder joint reliability. The concerns are not only void formation between the solder and copper substrate, however, formation and growth of inter-metallic compounds (IMCs) is a concern as well. These compounds are brittle materials in nature which could crack and fracture when subjected to mechanical or thermo-mechanical loading leading to possible electrical or overheating failures. A design of experiment has been prepared using industrial electronic modules out of production line with an aim to understand the governing factors determining the reliability of electronic control units under environmental loading conditions. The modules have been stressed in active mode using different designed stress conditions. Failure analysis follows the aging process including functional testing, metallography and microscopy investigations. Evolution of the interfacial structure as well as the mechanical reliability of the solder joints under the different stressing conditions is discussed. Based on the observations obtained from this study, a deep understanding of the aging mechanisms under different environmental stress conditions has been reached. It has been concluded that the solder joint failure mechanisms are more dominant than failure mechanisms of other components. IMCs growth, voiding and cracking in the solder joints under thermal and thermo-mechanical loading is observed which could lead to malfunctioning due to electrical failures or overheating.
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