180nm CMOS中RHBD逆变电池的设计与性能对比仿真

Pablo Ilha Vaz, G. Wirth
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引用次数: 8

摘要

本文提出了一种逆变器电池的抗辐射设计方法(RHBD)。该设计考虑使用标准CMOS工艺和商业PDK,重点是将设计完全纳入CAD工具,允许自动放置和布线。为了分析和比较标准单元和拟议器件在功率、延迟和面积消耗方面的性能,进行了角场和蒙特卡罗模拟。仿真结果表明,通过交换面积和电路密度,可以合成具有等效性能的自动化RHBD。此外,与标准单元相比,在NMOS和PMOS网络中采用封闭栅极技术可以改善传播延迟、能量消耗和减少可变性。
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Design and comparative performance simulation of RHBD inverter cells in 180nm CMOS
In this work, the Radiation Hardened by Design (RHBD) of an inverter cell is proposed. The design considers the use of standard CMOS processes with commercial PDK, focusing on fully incorporating the design into CAD tools allowing the automatic place & route. Corners and Monte Carlo simulations were performed in order to analyze and compare the performances between the standard cells and proposed devices in terms of power, delay, and area consumption. The simulated results indicate that by trading of area and circuit density it is possible to synthesize an automated RHBD with an equivalent performance. Moreover, employing enclosed gate technique in both NMOS and PMOS networks improved propagation delay, energy consumption and lead to reduced variability if compared to standard cells.
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