T. Michel, R. Leveugle, G. Saucier, R. Doucet, P. Chapier
{"title":"利用asic以非常低的开销提高可靠性/spl lsqb/PLC/spl rsqb/","authors":"T. Michel, R. Leveugle, G. Saucier, R. Doucet, P. Chapier","doi":"10.1109/EDTC.1994.326905","DOIUrl":null,"url":null,"abstract":"On-line test mechanisms have been designed for the CPU of a programmable logic controller. Specific devices integrated in an ASIC processor perform control flow checking during both application and system program executions. A prototype has been implemented, demonstrating the very low overhead of the approach. Results of fault injections have then proved the dependability increase at system level.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Taking advantage of ASICs to improve dependability with very low overheads /spl lsqb/PLC/spl rsqb/\",\"authors\":\"T. Michel, R. Leveugle, G. Saucier, R. Doucet, P. Chapier\",\"doi\":\"10.1109/EDTC.1994.326905\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On-line test mechanisms have been designed for the CPU of a programmable logic controller. Specific devices integrated in an ASIC processor perform control flow checking during both application and system program executions. A prototype has been implemented, demonstrating the very low overhead of the approach. Results of fault injections have then proved the dependability increase at system level.<<ETX>>\",\"PeriodicalId\":244297,\"journal\":{\"name\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-02-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1994.326905\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326905","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Taking advantage of ASICs to improve dependability with very low overheads /spl lsqb/PLC/spl rsqb/
On-line test mechanisms have been designed for the CPU of a programmable logic controller. Specific devices integrated in an ASIC processor perform control flow checking during both application and system program executions. A prototype has been implemented, demonstrating the very low overhead of the approach. Results of fault injections have then proved the dependability increase at system level.<>