含难熔铱肖特基栅金属的高性能InAs/AlSb HEMT

Wen-Yu Lin, Chao-Hung Chen, H. Chiu, F. Huang, W. Hsueh, Y. Hsin, J. Chyi
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摘要

本文提出并研究了一种利用铱栅极技术制备高性能InAs/AlSb高电子迁移率晶体管的新方法。ir栅极具有优异的金属功功能,有利于将InAs/AlSb异质结构的Schottky势垒高度(ØB)从0.54 eV提高到0.58 eV。ir栅InAs/AlSb HEMT的电压为-0.9 V,最大漏极电流为270 mA/mm,峰值跨导为420 mS/mm。相比之下,ti栅极InAs/AlSb HEMT的Vth为- 1.5 V,最大漏极电流为257mA/mm,峰值跨导为280mS /mm。认为红外接口在大功率晶体管中具有很大的应用潜力。
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High performacne InAs/AlSb HEMT with refractory iridium Schottky gate metal
In the work, a novel approach in fabricating high-performance of InAs/AlSb high electron mobility transistors using iridium (Ir) gate technology was proposed and investigated. The Ir-gate exhibited a superior metal work function which was beneficial for increasing Schottky barrier height (ØB) of InAs/AlSb heterostructure from 0.54 to 0.58 eV. The Ir-gate InAs/AlSb HEMT exhibited a Vth of -0.9 V, a maximum drain current of 270 mA/mm, and a peak transconductance of 420 mS/mm. In contrast, the Vth of Ti-gate InAs/AlSb HEMT was - 1.5 V, a maximum drain current of 257mA/mm, and a peak transconductance of 280mS /mm, respectively. It was suggested that Ir interface presented a high potential for high power transistor applications.
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