不同生长参数下厚YIG外延体系结构的x射线研究

I. Fodchuk, I. Hutsuliak, V. Dovganyuk, A. Kuzmin, Y. Roman, M. Solodkyi, P. Pynuk, P. Lytvyn, O. Gudymenko, I. Syvorotka, M. Barchuk
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引用次数: 1

摘要

采用原子扫描显微镜、磁力扫描显微镜和高分辨率Х-ray衍射仪研究了不同厚度铁石榴石薄膜的晶体结构和磁畴结构。提出并证实了石榴石薄膜是一组具有一定横向尺寸的垂直柱的模型。在该模型中,使用蒙特卡罗方法计算了互易晶格点附近的x射线强度分布,以确定具有不同汉堡矢量的两种位错类型的密度。
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X-ray investigations of structure of thick YIG epitaxial systems of different growth parameters
Crystal and magnetic domain structures of iron garnet films with different thicknesses are studied by means of atomic and magnetic force scanning microscopies as well as by means of high-resolution Х-ray diffraction. The model of the garnet films as a set of vertical columns with certain lateral sizes is proposed and substantiated. Within this model, X-ray intensity distributions in the vicinity of the reciprocal lattice points are calculated using the Monte Carlo approach to determine densities of two dislocation types with different Burgers vectors.
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