{"title":"一种用于片上测量的新型共面波导矢量网络分析仪","authors":"J. Bellantoni, R. Compton","doi":"10.1109/CORNEL.1989.79836","DOIUrl":null,"url":null,"abstract":"A new coplanar-waveguide network analyzer system that is specifically designed for on-wafer characterization of millimeter-wave devices and circuits is presented. The analyzer is made entirely in coplanar-waveguide to achieve large bandwidths and eliminate all discontinuities between the test set and wafer except the probe tip contacts. The analyzer is made by spacing detector diodes logarithmically along the coplanar-waveguide probe-tip to sample the signal, and it uses six-port theory to calculate complex scattering parameters. A 15.7-GHz prototype analyzer has been demonstrated.<<ETX>>","PeriodicalId":445524,"journal":{"name":"Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A new coplanar waveguide vector network analyzer for on-wafer measurements\",\"authors\":\"J. Bellantoni, R. Compton\",\"doi\":\"10.1109/CORNEL.1989.79836\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new coplanar-waveguide network analyzer system that is specifically designed for on-wafer characterization of millimeter-wave devices and circuits is presented. The analyzer is made entirely in coplanar-waveguide to achieve large bandwidths and eliminate all discontinuities between the test set and wafer except the probe tip contacts. The analyzer is made by spacing detector diodes logarithmically along the coplanar-waveguide probe-tip to sample the signal, and it uses six-port theory to calculate complex scattering parameters. A 15.7-GHz prototype analyzer has been demonstrated.<<ETX>>\",\"PeriodicalId\":445524,\"journal\":{\"name\":\"Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits,\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CORNEL.1989.79836\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CORNEL.1989.79836","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new coplanar waveguide vector network analyzer for on-wafer measurements
A new coplanar-waveguide network analyzer system that is specifically designed for on-wafer characterization of millimeter-wave devices and circuits is presented. The analyzer is made entirely in coplanar-waveguide to achieve large bandwidths and eliminate all discontinuities between the test set and wafer except the probe tip contacts. The analyzer is made by spacing detector diodes logarithmically along the coplanar-waveguide probe-tip to sample the signal, and it uses six-port theory to calculate complex scattering parameters. A 15.7-GHz prototype analyzer has been demonstrated.<>
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