{"title":"多层快闪记忆体的错误控制码方案","authors":"S. Gregori, G. Torelli, O. Khouri, R. Micheloni","doi":"10.1109/MTDT.2001.945227","DOIUrl":null,"url":null,"abstract":"Presents a new scheme for error control coding in multilevel Flash memories. The n bits stored in a single memory cell are organized in different \"bit-layers\", which are independent from one another. Error correction is carried out separately for each bit-layer. The correction of any failure in a single memory cell is therefore achieved by using a simple error control code (ECC) providing single-bit correction, regardless of the number of bits stored in a single cell. This greatly simplifies the encoding and decoding circuits and minimizes the impact of ECC time overhead on memory access time. Moreover the same encoding/decoding circuit and check cells are used with multilevel memories working at a variable number of bits per cell.","PeriodicalId":159230,"journal":{"name":"Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"An error control code scheme for multilevel Flash memories\",\"authors\":\"S. Gregori, G. Torelli, O. Khouri, R. Micheloni\",\"doi\":\"10.1109/MTDT.2001.945227\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presents a new scheme for error control coding in multilevel Flash memories. The n bits stored in a single memory cell are organized in different \\\"bit-layers\\\", which are independent from one another. Error correction is carried out separately for each bit-layer. The correction of any failure in a single memory cell is therefore achieved by using a simple error control code (ECC) providing single-bit correction, regardless of the number of bits stored in a single cell. This greatly simplifies the encoding and decoding circuits and minimizes the impact of ECC time overhead on memory access time. Moreover the same encoding/decoding circuit and check cells are used with multilevel memories working at a variable number of bits per cell.\",\"PeriodicalId\":159230,\"journal\":{\"name\":\"Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.2001.945227\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.2001.945227","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An error control code scheme for multilevel Flash memories
Presents a new scheme for error control coding in multilevel Flash memories. The n bits stored in a single memory cell are organized in different "bit-layers", which are independent from one another. Error correction is carried out separately for each bit-layer. The correction of any failure in a single memory cell is therefore achieved by using a simple error control code (ECC) providing single-bit correction, regardless of the number of bits stored in a single cell. This greatly simplifies the encoding and decoding circuits and minimizes the impact of ECC time overhead on memory access time. Moreover the same encoding/decoding circuit and check cells are used with multilevel memories working at a variable number of bits per cell.