S. Levantino, C. Samori, M. Banu, Jack Glas, V. Boccuzzi
{"title":"用于无线应用的减少混叠的CMOS中频采样电路","authors":"S. Levantino, C. Samori, M. Banu, Jack Glas, V. Boccuzzi","doi":"10.1109/ISSCC.2002.993103","DOIUrl":null,"url":null,"abstract":"An IF-sampling technique rejects even-order alias channels. A 0.25 /spl mu/m CMOS test chip demonstrates 27 dB anti-aliasing rejection, 70 dB dynamic range, and -121 dBm/Hz noise floor, for a 377 MHz IF GSM signal, with 52 MHz sampling rate.","PeriodicalId":423674,"journal":{"name":"2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A CMOS IF sampling circuit with reduced aliasing for wireless applications\",\"authors\":\"S. Levantino, C. Samori, M. Banu, Jack Glas, V. Boccuzzi\",\"doi\":\"10.1109/ISSCC.2002.993103\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An IF-sampling technique rejects even-order alias channels. A 0.25 /spl mu/m CMOS test chip demonstrates 27 dB anti-aliasing rejection, 70 dB dynamic range, and -121 dBm/Hz noise floor, for a 377 MHz IF GSM signal, with 52 MHz sampling rate.\",\"PeriodicalId\":423674,\"journal\":{\"name\":\"2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2002.993103\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2002.993103","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A CMOS IF sampling circuit with reduced aliasing for wireless applications
An IF-sampling technique rejects even-order alias channels. A 0.25 /spl mu/m CMOS test chip demonstrates 27 dB anti-aliasing rejection, 70 dB dynamic range, and -121 dBm/Hz noise floor, for a 377 MHz IF GSM signal, with 52 MHz sampling rate.