{"title":"15.8用于600V超结mosfet的具有鲁棒离散时间反馈技术的4.5V/ns有源螺杆速率控制栅极驱动器","authors":"S. Kawai, T. Ueno, Kohei Onizuka","doi":"10.1109/ISSCC.2019.8662534","DOIUrl":null,"url":null,"abstract":"Active gate control is an emerging technique to minimize the switching loss of high-power converters facing noise-suppression challenges. In a conventional gate-driver design, a fixed value of gate resistance is chosen by the converter designers so that the slew rate (SR) of the drain voltage Vd, namely $dV_{d}/$dt, does not exceed noise-aware design guidelines in each application and use case. Minimizing the gate resistance leads to high $dV_{d}/$dt and the reduction in switching loss while shortening the turn-on delay for the overall converter performance. However, the impact is limited because of uncontrollable $dV_{d}/$dt drift caused by load-current, temperature, and $\\mathrm {V}_{th}$ variations of the power transistors. Thus, in practice there is significant room for further loss and turn-on-delay minimization for the active gate control that adaptively modulates gate driving ability within every switching cycle.","PeriodicalId":265551,"journal":{"name":"2019 IEEE International Solid- State Circuits Conference - (ISSCC)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"15.8 A 4.5V/ns Active Slew-Rate-Controlling Gate Driver with Robust Discrete-Time Feedback Technique for 600V Superjunction MOSFETs\",\"authors\":\"S. Kawai, T. Ueno, Kohei Onizuka\",\"doi\":\"10.1109/ISSCC.2019.8662534\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Active gate control is an emerging technique to minimize the switching loss of high-power converters facing noise-suppression challenges. In a conventional gate-driver design, a fixed value of gate resistance is chosen by the converter designers so that the slew rate (SR) of the drain voltage Vd, namely $dV_{d}/$dt, does not exceed noise-aware design guidelines in each application and use case. Minimizing the gate resistance leads to high $dV_{d}/$dt and the reduction in switching loss while shortening the turn-on delay for the overall converter performance. However, the impact is limited because of uncontrollable $dV_{d}/$dt drift caused by load-current, temperature, and $\\\\mathrm {V}_{th}$ variations of the power transistors. Thus, in practice there is significant room for further loss and turn-on-delay minimization for the active gate control that adaptively modulates gate driving ability within every switching cycle.\",\"PeriodicalId\":265551,\"journal\":{\"name\":\"2019 IEEE International Solid- State Circuits Conference - (ISSCC)\",\"volume\":\"65 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Solid- State Circuits Conference - (ISSCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2019.8662534\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Solid- State Circuits Conference - (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2019.8662534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
15.8 A 4.5V/ns Active Slew-Rate-Controlling Gate Driver with Robust Discrete-Time Feedback Technique for 600V Superjunction MOSFETs
Active gate control is an emerging technique to minimize the switching loss of high-power converters facing noise-suppression challenges. In a conventional gate-driver design, a fixed value of gate resistance is chosen by the converter designers so that the slew rate (SR) of the drain voltage Vd, namely $dV_{d}/$dt, does not exceed noise-aware design guidelines in each application and use case. Minimizing the gate resistance leads to high $dV_{d}/$dt and the reduction in switching loss while shortening the turn-on delay for the overall converter performance. However, the impact is limited because of uncontrollable $dV_{d}/$dt drift caused by load-current, temperature, and $\mathrm {V}_{th}$ variations of the power transistors. Thus, in practice there is significant room for further loss and turn-on-delay minimization for the active gate control that adaptively modulates gate driving ability within every switching cycle.