化学放大光刻胶产生高密度锥形微凸点的建模与仿真

Daiki Kumagwa, M. Sakamoto, Yohei Aoki, T. Asano
{"title":"化学放大光刻胶产生高密度锥形微凸点的建模与仿真","authors":"Daiki Kumagwa, M. Sakamoto, Yohei Aoki, T. Asano","doi":"10.1109/EPTC.2018.8654401","DOIUrl":null,"url":null,"abstract":"The cone-shaped micro bump provides fine-pitch room-temperature flip-chip Bonding technology. It has been demonstrated to be able to connect $15 \\mu \\mathrm {m}$-pitch 640x512 array pixels of an image sensor composed of a compound semiconductor photodetector array and silicon readout integrated circuit. The cone-shaped micro bump is fabricated by utilizing the characteristic of the chemical amplification photoresist. For further shrinkage of the interconnection pitch below $10 \\mu \\mathrm {m}$, not only refining of process condition But also a new design of photoresist is required. In this work, we build a model and a simulation method to investigate how the property of the photoresist and process condition determine the final shape of the cone bump.","PeriodicalId":360239,"journal":{"name":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling and simulation of chemical amplification photoresist to produce high-density cone-shaped micro bumps\",\"authors\":\"Daiki Kumagwa, M. Sakamoto, Yohei Aoki, T. Asano\",\"doi\":\"10.1109/EPTC.2018.8654401\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The cone-shaped micro bump provides fine-pitch room-temperature flip-chip Bonding technology. It has been demonstrated to be able to connect $15 \\\\mu \\\\mathrm {m}$-pitch 640x512 array pixels of an image sensor composed of a compound semiconductor photodetector array and silicon readout integrated circuit. The cone-shaped micro bump is fabricated by utilizing the characteristic of the chemical amplification photoresist. For further shrinkage of the interconnection pitch below $10 \\\\mu \\\\mathrm {m}$, not only refining of process condition But also a new design of photoresist is required. In this work, we build a model and a simulation method to investigate how the property of the photoresist and process condition determine the final shape of the cone bump.\",\"PeriodicalId\":360239,\"journal\":{\"name\":\"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2018.8654401\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2018.8654401","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

锥形微凸点提供了细间距室温倒装芯片键合技术。它已被证明能够连接由复合半导体光电探测器阵列和硅读出集成电路组成的图像传感器的$15 \mu \ mathm {m}$-pitch 640x512阵列像素。利用化学放大光刻胶的特性制备了锥形微凸点。为了使互连间距进一步缩小到$10 \mu \ mathm {m}$以下,不仅需要改进工艺条件,而且需要设计新的光刻胶。在这项工作中,我们建立了一个模型和仿真方法来研究光刻胶的性质和工艺条件如何决定锥形凸起的最终形状。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Modeling and simulation of chemical amplification photoresist to produce high-density cone-shaped micro bumps
The cone-shaped micro bump provides fine-pitch room-temperature flip-chip Bonding technology. It has been demonstrated to be able to connect $15 \mu \mathrm {m}$-pitch 640x512 array pixels of an image sensor composed of a compound semiconductor photodetector array and silicon readout integrated circuit. The cone-shaped micro bump is fabricated by utilizing the characteristic of the chemical amplification photoresist. For further shrinkage of the interconnection pitch below $10 \mu \mathrm {m}$, not only refining of process condition But also a new design of photoresist is required. In this work, we build a model and a simulation method to investigate how the property of the photoresist and process condition determine the final shape of the cone bump.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Package Integrity and Reliability Effects of Mold Compound Chemistry for Power Device Application Kirkendall Voids Improvement in Thin Small No Lead Package Implementation of High-Temperature Pressure Sensor Package and Characterization up to 500°C EPIC Via Last on SOI Wafer Integration Challenges Laser hybrid integration on silicon photonic integrated circuits with reflected grating
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1