{"title":"化学放大光刻胶产生高密度锥形微凸点的建模与仿真","authors":"Daiki Kumagwa, M. Sakamoto, Yohei Aoki, T. Asano","doi":"10.1109/EPTC.2018.8654401","DOIUrl":null,"url":null,"abstract":"The cone-shaped micro bump provides fine-pitch room-temperature flip-chip Bonding technology. It has been demonstrated to be able to connect $15 \\mu \\mathrm {m}$-pitch 640x512 array pixels of an image sensor composed of a compound semiconductor photodetector array and silicon readout integrated circuit. The cone-shaped micro bump is fabricated by utilizing the characteristic of the chemical amplification photoresist. For further shrinkage of the interconnection pitch below $10 \\mu \\mathrm {m}$, not only refining of process condition But also a new design of photoresist is required. In this work, we build a model and a simulation method to investigate how the property of the photoresist and process condition determine the final shape of the cone bump.","PeriodicalId":360239,"journal":{"name":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling and simulation of chemical amplification photoresist to produce high-density cone-shaped micro bumps\",\"authors\":\"Daiki Kumagwa, M. Sakamoto, Yohei Aoki, T. Asano\",\"doi\":\"10.1109/EPTC.2018.8654401\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The cone-shaped micro bump provides fine-pitch room-temperature flip-chip Bonding technology. It has been demonstrated to be able to connect $15 \\\\mu \\\\mathrm {m}$-pitch 640x512 array pixels of an image sensor composed of a compound semiconductor photodetector array and silicon readout integrated circuit. The cone-shaped micro bump is fabricated by utilizing the characteristic of the chemical amplification photoresist. For further shrinkage of the interconnection pitch below $10 \\\\mu \\\\mathrm {m}$, not only refining of process condition But also a new design of photoresist is required. In this work, we build a model and a simulation method to investigate how the property of the photoresist and process condition determine the final shape of the cone bump.\",\"PeriodicalId\":360239,\"journal\":{\"name\":\"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2018.8654401\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2018.8654401","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling and simulation of chemical amplification photoresist to produce high-density cone-shaped micro bumps
The cone-shaped micro bump provides fine-pitch room-temperature flip-chip Bonding technology. It has been demonstrated to be able to connect $15 \mu \mathrm {m}$-pitch 640x512 array pixels of an image sensor composed of a compound semiconductor photodetector array and silicon readout integrated circuit. The cone-shaped micro bump is fabricated by utilizing the characteristic of the chemical amplification photoresist. For further shrinkage of the interconnection pitch below $10 \mu \mathrm {m}$, not only refining of process condition But also a new design of photoresist is required. In this work, we build a model and a simulation method to investigate how the property of the photoresist and process condition determine the final shape of the cone bump.