J. Wang, J. Kwon, J. Yoon, H. Wang, T. Haugan, F. Baca, N. Pierce, P. Barnes
{"title":"沉积温度对YBCO输运性能的影响","authors":"J. Wang, J. Kwon, J. Yoon, H. Wang, T. Haugan, F. Baca, N. Pierce, P. Barnes","doi":"10.1109/ISAF.2008.4693798","DOIUrl":null,"url":null,"abstract":"In this paper, we report a strong correlation between the stacking fault (SF) density and the critical current density of YBa2Cu3O7¿¿ (YBCO) thin films in applied field (Jcin-field). We found that the Jcin-field increases as the deposition temperature increases (775°C ¿ 825°C) for the samples grown on both SrTiO3 (STO) and LaAlO3 substrates. An interesting linear relation is observed between the SF density and the Jcin-field value, which suggests that the YBCO SF density plays an important role in the YBCO in-field transport performance.","PeriodicalId":228914,"journal":{"name":"2008 17th IEEE International Symposium on the Applications of Ferroelectrics","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"NA008 Deposition temperature dependence of YBCO transport properties\",\"authors\":\"J. Wang, J. Kwon, J. Yoon, H. Wang, T. Haugan, F. Baca, N. Pierce, P. Barnes\",\"doi\":\"10.1109/ISAF.2008.4693798\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we report a strong correlation between the stacking fault (SF) density and the critical current density of YBa2Cu3O7¿¿ (YBCO) thin films in applied field (Jcin-field). We found that the Jcin-field increases as the deposition temperature increases (775°C ¿ 825°C) for the samples grown on both SrTiO3 (STO) and LaAlO3 substrates. An interesting linear relation is observed between the SF density and the Jcin-field value, which suggests that the YBCO SF density plays an important role in the YBCO in-field transport performance.\",\"PeriodicalId\":228914,\"journal\":{\"name\":\"2008 17th IEEE International Symposium on the Applications of Ferroelectrics\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 17th IEEE International Symposium on the Applications of Ferroelectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2008.4693798\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 17th IEEE International Symposium on the Applications of Ferroelectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2008.4693798","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
NA008 Deposition temperature dependence of YBCO transport properties
In this paper, we report a strong correlation between the stacking fault (SF) density and the critical current density of YBa2Cu3O7¿¿ (YBCO) thin films in applied field (Jcin-field). We found that the Jcin-field increases as the deposition temperature increases (775°C ¿ 825°C) for the samples grown on both SrTiO3 (STO) and LaAlO3 substrates. An interesting linear relation is observed between the SF density and the Jcin-field value, which suggests that the YBCO SF density plays an important role in the YBCO in-field transport performance.
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