{"title":"负电容场效应晶体管锗纳米片沟道的研究","authors":"Yu-ning Chen, F. Hou, C. Su, Yung-Chun Wu","doi":"10.23919/SNW.2019.8782940","DOIUrl":null,"url":null,"abstract":"This work demonstrates the germanium nanosheet channel with negative capacitance in gate-all-around field-effect-transistor (Ge NS NC-GAAFET) to reduce the subthreshold slope (SS). The Ge NS NC-GAAFET device structure, fabrication, and electrical are analysis were studied. Moreover, the Ge NS NC-FET reveals high driving current, and high Ion/Ioff ratio (>106). The novel Ge NS NC-FET could suit for future low-power integrated circuit applications.","PeriodicalId":170513,"journal":{"name":"2019 Silicon Nanoelectronics Workshop (SNW)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Study of Germanium Nanosheet Channel With Negative Capacitance Field-Effect-Transistor\",\"authors\":\"Yu-ning Chen, F. Hou, C. Su, Yung-Chun Wu\",\"doi\":\"10.23919/SNW.2019.8782940\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work demonstrates the germanium nanosheet channel with negative capacitance in gate-all-around field-effect-transistor (Ge NS NC-GAAFET) to reduce the subthreshold slope (SS). The Ge NS NC-GAAFET device structure, fabrication, and electrical are analysis were studied. Moreover, the Ge NS NC-FET reveals high driving current, and high Ion/Ioff ratio (>106). The novel Ge NS NC-FET could suit for future low-power integrated circuit applications.\",\"PeriodicalId\":170513,\"journal\":{\"name\":\"2019 Silicon Nanoelectronics Workshop (SNW)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 Silicon Nanoelectronics Workshop (SNW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/SNW.2019.8782940\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Silicon Nanoelectronics Workshop (SNW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/SNW.2019.8782940","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of Germanium Nanosheet Channel With Negative Capacitance Field-Effect-Transistor
This work demonstrates the germanium nanosheet channel with negative capacitance in gate-all-around field-effect-transistor (Ge NS NC-GAAFET) to reduce the subthreshold slope (SS). The Ge NS NC-GAAFET device structure, fabrication, and electrical are analysis were studied. Moreover, the Ge NS NC-FET reveals high driving current, and high Ion/Ioff ratio (>106). The novel Ge NS NC-FET could suit for future low-power integrated circuit applications.