GaAs/AlGaAs MODFET材料制备光导隙的场坍缩延迟

J. Sheridan, B. Nechay, D. Bloom, P. Solomon, Y. Pao
{"title":"GaAs/AlGaAs MODFET材料制备光导隙的场坍缩延迟","authors":"J. Sheridan, B. Nechay, D. Bloom, P. Solomon, Y. Pao","doi":"10.1109/CORNEL.1993.303113","DOIUrl":null,"url":null,"abstract":"We report the fabrication of a 1 /spl mu/m photoconductive gap voltage step generator with constant output voltage of 0.10 V for 100 ps and a 2 ps rise time. The photoconductor is fabricated on GaAs/AlGaAs MODFET material and uses the two-dimensional electron gas in the FET channel as the conductive medium. It is fully process-compatible with MODFETs. In devices with standard ohmic contacts, the output current stayed constant for up to 50 ps, even though the electric field in the gap is expected to collapse in less than 1 ps. Two-dimensional device simulations show that, although the field in the gap does collapse on the expected time scale, the current is initially determined by the contacts. A new photoconductor design, in which the ohmic contacts are laterally recessed from the etched gap region, further delayed field collapse, extending constant voltage operation to 100 ps.<<ETX>>","PeriodicalId":129440,"journal":{"name":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Delay of field collapse in photoconductive gaps fabricated on GaAs/AlGaAs MODFET material\",\"authors\":\"J. Sheridan, B. Nechay, D. Bloom, P. Solomon, Y. Pao\",\"doi\":\"10.1109/CORNEL.1993.303113\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report the fabrication of a 1 /spl mu/m photoconductive gap voltage step generator with constant output voltage of 0.10 V for 100 ps and a 2 ps rise time. The photoconductor is fabricated on GaAs/AlGaAs MODFET material and uses the two-dimensional electron gas in the FET channel as the conductive medium. It is fully process-compatible with MODFETs. In devices with standard ohmic contacts, the output current stayed constant for up to 50 ps, even though the electric field in the gap is expected to collapse in less than 1 ps. Two-dimensional device simulations show that, although the field in the gap does collapse on the expected time scale, the current is initially determined by the contacts. A new photoconductor design, in which the ohmic contacts are laterally recessed from the etched gap region, further delayed field collapse, extending constant voltage operation to 100 ps.<<ETX>>\",\"PeriodicalId\":129440,\"journal\":{\"name\":\"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CORNEL.1993.303113\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CORNEL.1993.303113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

我们报道了1 /spl mu/m光导间隙电压阶跃发生器的制造,其恒定输出电压为0.10 V,持续100 ps,上升时间为2 ps。该光电导体采用GaAs/AlGaAs MODFET材料,利用FET沟道中的二维电子气体作为导电介质。它与modfet完全兼容。在具有标准欧姆触点的设备中,输出电流保持恒定高达50ps,即使缺口中的电场预计在不到1ps的时间内崩溃。二维设备模拟表明,尽管缺口中的电场确实在预期的时间尺度上崩溃,但电流最初是由触点决定的。一种新的光导体设计,其中欧姆触点从蚀刻隙区侧向嵌入,进一步延迟了场坍塌,将恒压工作扩展到100 ps.>
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Delay of field collapse in photoconductive gaps fabricated on GaAs/AlGaAs MODFET material
We report the fabrication of a 1 /spl mu/m photoconductive gap voltage step generator with constant output voltage of 0.10 V for 100 ps and a 2 ps rise time. The photoconductor is fabricated on GaAs/AlGaAs MODFET material and uses the two-dimensional electron gas in the FET channel as the conductive medium. It is fully process-compatible with MODFETs. In devices with standard ohmic contacts, the output current stayed constant for up to 50 ps, even though the electric field in the gap is expected to collapse in less than 1 ps. Two-dimensional device simulations show that, although the field in the gap does collapse on the expected time scale, the current is initially determined by the contacts. A new photoconductor design, in which the ohmic contacts are laterally recessed from the etched gap region, further delayed field collapse, extending constant voltage operation to 100 ps.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
LT-GaAs-MIS-diode characteristics and equivalent circuit model Reliability of strained quantum well lasers Development of an appropriate model for the design of D-band InP Gunn devices p/sup +/-thin surface layer Schottky-barrier enhanced high speed pseudomorphic Al/sub 0.25/Ga/sub 0.75/As/In/sub 0.15/Ga/sub 0.85/As and Ga/sub 0.5/In/sub 0.5/P/In/sub 0.15/Ga/sub 0.85/As MODFETs Monte Carlo simulation of wide AlGaAs barriers
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1